Datasheet IRF530 (On Semiconductor) - 6

HerstellerOn Semiconductor
BeschreibungTMOS E−FET Power Field Effect. Transistor N−Channel Enhancement−Mode Silicon Gate
Seiten / Seite7 / 6 — IRF530. SAFE OPERATING AREA. Figure 11. Maximum Rated Forward Biased. …
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IRF530. SAFE OPERATING AREA. Figure 11. Maximum Rated Forward Biased. Figure 12. Maximum Avalanche Energy versus

IRF530 SAFE OPERATING AREA Figure 11 Maximum Rated Forward Biased Figure 12 Maximum Avalanche Energy versus

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IRF530 SAFE OPERATING AREA
100 110 V I GS = 20 V D = 14 A 100 SINGLE PULSE T 10μs 90 C = 25°C O−SOURCE (mJ) 80 (AMPS) 10 100μs 70 60 1ms 50 10ms 40 1.0 dc , DRAIN CURRENT 30 AVALANCHE ENERGY I D RDS(on) LIMIT 20 , SINGLE PULSE DRAIN−T THERMAL LIMIT 10 PACKAGE LIMIT E AS 0.1 0 0.1 1.0 10 100 1000 25 50 75 100 125 15 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus Safe Operating Area Starting Junction Temperature
1.0 D = 0.5 ANCE 0.2 RESIST 0.1 P(pk) 0.1 0.05 RθJC(t) = r(t) RθJC THERMAL 0.02 D CURVES APPLY FOR POWER PULSE TRAIN SHOWN , NORMALIZED EFFECTIVE 0.01 t1 READ TIME AT t1 r(t) t2 TJ(pk) − TC = P(pk) RθJC(t) SINGLE PULSE TRANSIENT DUTY CYCLE, D = t1/t2 0.01 1.0E−05 1.0E−04 1.0E−03 1.0E−02 1.0E−01 1.0E+00 t, TIME (s)
Figure 13. Thermal Response
di/dt IS trr ta tb TIME tp 0.25 IS IS
Figure 14. Diode Reverse Recovery Waveform http://onsemi.com 6