Datasheet 2N3903, 2N3904 (ON Semiconductor) - 3

HerstellerON Semiconductor
BeschreibungGeneral Purpose Transistors
Seiten / Seite7 / 3 — 2N3903, 2N3904. ORDERING INFORMATION. Device. Package. Shipping. Figure …
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DokumentenspracheEnglisch

2N3903, 2N3904. ORDERING INFORMATION. Device. Package. Shipping. Figure 1. Delay and Rise Time Equivalent Test Circuit

2N3903, 2N3904 ORDERING INFORMATION Device Package Shipping Figure 1 Delay and Rise Time Equivalent Test Circuit

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2N3903, 2N3904 ORDERING INFORMATION Device Package Shipping
† 2N3903RLRM TO−92 2000 / Ammo Pack 2N3904 TO−92 5000 Units / Bulk 2N3904G TO−92 5000 Units / Bulk (Pb−Free) 2N3904RLRA TO−92 2000 / Tape & Reel 2N3904RLRAG TO−92 2000 / Tape & Reel (Pb−Free) 2N3904RLRM TO−92 2000 / Ammo Pack 2N3904RLRMG TO−92 2000 / Ammo Pack (Pb−Free) 2N3904RLRP TO−92 2000 / Ammo Pack 2N3904RLRPG TO−92 2000 / Ammo Pack (Pb−Free) 2N3904RL1G TO−92 2000 / Tape & Reel (Pb−Free) 2N3904ZL1 TO−92 2000 / Ammo Pack 2N3904ZL1G TO−92 2000 / Ammo Pack (Pb−Free) †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. +3 V DUTY CYCLE = 2% 300 ns +10.9 V 275 10 k -0.5 V CS < 4 pF* < 1 ns * Total shunt capacitance of test jig and connectors
Figure 1. Delay and Rise Time Equivalent Test Circuit
+3 V 10 < t t 1 < 500 ms 1 +10.9 V DUTY CYCLE = 2% 275 10 k 0 1N916 CS < 4 pF* -9.1 V′ < 1 ns * Total shunt capacitance of test jig and connectors
Figure 2. Storage and Fall Time Equivalent Test Circuit http://onsemi.com 3