Datasheet ADXRS645 (Analog Devices) - 7

ADXRS645 Data Sheet TYPICAL PERFORMANCE CHARACTERISTICS 50 2700 ) % 2650 ( 40 TION ) 2600 LA mV U 30 ( OP UT P 2550 UT OF P O 20 L GE TA NUL 2500 N E C R 10 E P 2450 0 2400 –50 0 50 100 150 200
107
2450 2465 2480 2495 2510 2525 2540 2555 2570 2585 2600
104
TEMPERATURE (°C)
1958- 1
NULL OUTPUT (mV)
1958- 1 Figure 5. Null Output at 25°C Figure 8. Null Output Over Temperature
50 1.2 45 ) % 1.0 ( 40 ) TION 35 c e 0.8 LA °/s U 30 V/ OP 25 Y (m T 0.6 OF P IVI 20 T GE SI TA 0.4 N 15 E SEN C R 10 E P 0.2 5 0 0
108
88 91 94 97 00 03 06 09 12 15 18 –50 0 50 100 150 200 0. 0. 0. 0. 1. 1. 1. 1. 1. 1. 1.
105
TEMPERATURE (°C)
1958- 1
SENSITIVITY (mV/°/sec)
1958- 1 Figure 6. Sensitivity at 25°C Figure 9. Sensitivity Over Temperature
35 0 –200 ) 30 % ( –400 25 TION –600 LA U °/sec) –800 20 ( OP UT P –1000 OF P 15 UT –1200 GE 1 O T TA S N 10 –1400 E C R –1600 E P 5 –1800 0 –2000 –50 0 50 100 150 200
109
–1600 –1550 –1500 –1450 –1400 –1350 –1300 –1250 –1200 –1150 –1100
106
TEMPERATURE (°C)
1958- 1
ST1 OUTPUT CHANGE (°/sec)
1958- 1 Figure 7. ST1 Output Change at 25°C (VRATIO = 5 V) Figure 10. ST1 Output Over Temperature Rev. A | Page 6 of 10 Document Outline Features Applications General Description Functional Block Diagram Table of Contents Revision History Specifications Absolute Maximum Ratings Rate Sensitive Axis ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Setting Bandwidth Temperature Output and Calibration Supply Ratiometricity Range Extension Self-Test Function Continuous Self-Test Outline Dimensions Ordering Guide