Datasheet ADXL180 (Analog Devices) - 5

HerstellerAnalog Devices
BeschreibungConfigurable, High-g, iMEMS® Accelerometer
Seiten / Seite61 / 5 — ADXL180. SPECIFICATIONS. Table 1. Parameter1. Symbol Min Typ. Max Unit. …
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DokumentenspracheEnglisch

ADXL180. SPECIFICATIONS. Table 1. Parameter1. Symbol Min Typ. Max Unit. Test. Conditions/Comments

ADXL180 SPECIFICATIONS Table 1 Parameter1 Symbol Min Typ Max Unit Test Conditions/Comments

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ADXL180 SPECIFICATIONS
TA = −40°C to +125°C, VBP − VBN = 5.0 V to 14.5 V, fLP = 400 Hz, acceleration = 0 g, unless otherwise noted.
Table 1. Parameter1 Symbol Min Typ Max Unit Test Conditions/Comments
SENSOR Scale Factor Measurement frequency: 100 Hz 50 g Range See Table 37 8-Bit Data 0.465 0.50 0.535 g/LSB 10-Bit Data 0.116 0.1250 0.134 g/LSB 100 g Range 8-Bit Data 0.930 1.00 1.070 g/LSB 10-Bit Data 0.233 0.2500 0.268 g/LSB 150 g Range 8-Bit Data 1.395 1.50 1.605 g/LSB 10-Bit Data 0.349 0.3750 0.401 g/LSB 200 g Range 8-Bit Data 1.860 2.00 2.140 g/LSB 10-Bit Data 0.465 0.5000 0.535 g/LSB 250 g Range 8-Bit Data 2.325 2.50 2.675 g/LSB 10-Bit Data 0.581 0.625 0.669 g/LSB 350 g Range 8-bit Data 3.255 3.50 3.745 g/LSB 10-bit Data 0.830 0.8925 0.955 g/LSB 500 g Range 8-Bit Data 4.650 5.00 5.350 g/LSB 10-Bit Data 1.163 1.2500 1.338 g/LSB Offset All ranges, auto-zero disabled 8-Bit Data −12 +11 LSB 10-Bit Data −48 +47 LSB Noise (Peak-to-Peak) 50 g range 8-Bit Data 2 LSB 10 Hz to 400 Hz 10-Bit Data 2 3 LSB 10 Hz to 400 Hz Self Test Amplitude 20 25 30 g Internal Self-Test Limit 20 30 g STI enabled, see Table 35 Nonlinearity 0.2 2 % Of full-scale range Cross-Axis Sensitivity −5 +5 % Resonant Frequency 12.8 kHz Q 1.5 LOW-PASS FILTER Frequency Response Third-order Bessel Pass Band fLP Programmable, see Table 38 −3 dB Frequency 670 800 880 Hz −3 dB Frequency 335 400 440 Hz −3 dB Frequency 167.5 200 220 Hz −3 dB Frequency 83.75 100 110 Hz AUTO-ZERO Update Rate Slow Mode 5.0 sec/LSB 10-bit LSB Fast Mode 0.5 sec/LSB 10-bit LSB Rev. A | Page 4 of 60 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TERMINOLOGY THEORY OF OPERATION OVERVIEW ACCELERATION SENSOR SIGNAL PROCESSING DIGITAL COMMUNICATIONS STATE MACHINE 2-WIRE CURRENT MODULATED INTERFACE SYNCHRONOUS OPERATION AND DUAL DEVICE BUS PROGRAMMED MEMORY AND CONFIGURABILITY Factory-Programmed Serial Number and Manufacturer Information User-Programmable Data Register User-Programmed Configuration Physical Layer (ISO Layer 1) Data Link Layer (ISO Layer 2) Application Layer (ISO Layer 7) PHYSICAL INTERFACE APPLICATION CIRCUIT CURRENT MODULATION MANCHESTER DATA ENCODING OPERATION AT LOW VBP OR LOW VDD OPERATION AT HIGH VDD COMMUNICATIONS TIMING AND BUS TOPOLOGIES DATA TRANSMISSION ASYNCHRONOUS COMMUNICATION Asynchronous Single Device Point-to-Point Topology SYNCHRONOUS COMMUNICATION Configuring the ADXL180 for Synchronous Operation Synchronization Pulse Detection Bus Discharge Enable Synchronous Single Device Point-to-Point Topology SYNCHRONOUS COMMUNICATION MODE—DUAL DEVICE Configuring Synchronous Operation Delay Selection Fixed Delay Mode Autodelay Mode Dual Device Synchronous Parallel Topology Dual Device Synchronous Series Topology DATA FRAME DEFINITION DATA FRAME TRANSMISSION FORMAT DATA FRAME CONFIGURATION OPTIONS ACCELERATION DATA CODING STATE VECTOR CODING STATE VECTOR DESCRIPTIONS TRANSMISSION ERROR DETECTION OPTIONS CRC Encoding Parity Encoding APPLICATION LAYER: COMMUNICATION PROTOCOL STATE MACHINE ADXL180 STATE MACHINE PHASE 1: POWER-ON-RESET INITIALIZATION PHASE 2: DEVICE DATA TRANSMISSION Overview Influence of MD on Data Range Device Data Mapping in Phase 2 PHASE 2: MODE DESCRIPTION Mode 0 Asynchronous Mode Synchronous Mode Mode 1 Mode 2 Device Data User Bits and User Register (UREG) 10-Bit Data and Mode 2 Mode 3 Device Data User Register (UREG) Use with State Vector Enabled Illegal Configuration: Mode 3 and 8-Bit Data PHASE 3: SELF-TEST DIAGNOSTIC Concept of Self-Test Internal and External Self-Test Option External Self-Test Internal Self-Test Influence of MD Selections On Transmitted Self-Test Data PHASE 4: AUTO-ZERO INITIALIZATION Fast Auto-Zero Mode Error Reporting PHASE 5: NORMAL OPERATION Slow Auto-Zero Error Reporting SIGNAL RANGE AND FILTERING TRANSFER FUNCTION OVERVIEW RANGE THREE-POLE BESSEL FILTER AUTO-ZERO OPERATION Offset Drift Monitoring ERROR DETECTION OVERVIEW PARITY ERROR DUE TO COMMUNICATIONS PROTOCOL CONFIGURATION BIT ERROR SELF-TEST ERROR OFFSET ERROR/OFFSET DRIFT MONITORING VOLTAGE REGULATOR MONITOR RESET OPERATION TEST AND DIAGNOSTIC TOOLS VSCI SIGNAL CHAIN INPUT TEST PIN VSCO ANALOG SIGNAL CHAIN OUTPUT TEST PIN CONFIGURATION SPECIFICATION OVERVIEW CONFIGURATION MODE TRANSMIT COMMUNICATIONS PROTOCOL CONFIGURATION MODE COMMAND (RECEIVE) COMMUNICATIONS PROTOCOL CONFIGURATION MODE COMMUNICATIONS HANDSHAKING CONFIGURATION AND USER DATA REGISTERS CONFIGURATION MODE EXIT SERIAL NUMBER AND MANUFACTURER IDENTIFICATION DATA REGISTERS PROGRAMMING THE CONFIGURATION AND USER DATA REGISTERS OTP PROGRAMMING CONDITIONS AND CONSIDERATIONS CONFIGURATION/USER REGISTER OTP PARITY CONFIGURATION MODE ERROR REPORTING CONFIGURATION REGISTER REFERENCE UD[7:0] USER DATA BITS UD8 CONFIGURATION BIT BDE SCOE FDLY ADME STI FC[1:0] RG[2:0] MD[1:0] SYEN AZE ERC DAT SVD CUPAR AND CUPRG AXIS OF SENSITIVITY BRANDING OUTLINE DIMENSIONS ORDERING GUIDE