Datasheet MCP606, MCP607, MCP608 (Microchip) - 5

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MCP606/7/8/9 TEMPERATURE CHARACTERISTICS Electrical Characteristics:
Unless otherwise indicated, VDD = +2.5V to +5.5V and VSS = GND.
Parameters Sym Min Typ Max Units Conditions Temperature Ranges
Specified Temperature Range TA -40 — +85 °C Operating Temperature Range TA -40 — +125 °C
Note 1
Storage Temperature Range TA -65 — +150 °C
Thermal Package Resistances
Thermal Resistance, 5L-SOT23 θJA — 220.7 — °C/W Thermal Resistance, 8L-PDIP θJA — 89.3 — °C/W Thermal Resistance, 8L-SOIC θJA — 149.5 — °C/W Thermal Resistance, 8L-TSSOP θJA — 139 — °C/W Thermal Resistance, 14L-PDIP θJA — 70 — °C/W Thermal Resistance, 14L-SOIC θJA — 95.3 — °C/W Thermal Resistance, 14L-TSSOP θJA — 100 — °C/W
Note 1:
The MCP606/7/8/9 operate over this extended temperature range, but with reduced performance. In any case, the Junction Temperature (TJ) must not exceed the Absolute Maximum specification of +150°C.
1.1 Test Circuits
The test circuits used for the DC and AC tests are shown in Figure 1-2 and Figure 1-3. The bypass capacitors are laid out according to the rules discussed in
Section 4.5 “Supply Bypass”
. VDD 1 µF V 0.1 µF IN R V N OUT
MCP60X
CL RL R V G RF DD/2 VL
FIGURE 1-2:
AC and DC Test Circuit for Most Non-Inverting Gain Conditions. VDD 1 µF V 0.1 µF DD/2 R V N OUT
MCP60X
CL RL R V G RF IN VL
FIGURE 1-3:
AC and DC Test Circuit for Most Inverting Gain Conditions. © 2009 Microchip Technology Inc. DS11177F-page 5 Document Outline 1.0 Electrical Characteristics FIGURE 1-1: Timing Diagram for the CS Pin on the MCP608. 1.1 Test Circuits FIGURE 1-2: AC and DC Test Circuit for Most Non-Inverting Gain Conditions. FIGURE 1-3: AC and DC Test Circuit for Most Inverting Gain Conditions. 2.0 Typical Performance Curves FIGURE 2-1: Input Offset Voltage at VDD = 5.5V. FIGURE 2-2: Input Offset Voltage at VDD = 2.5V. FIGURE 2-3: Quiescent Current vs. Power Supply Voltage. FIGURE 2-4: Input Offset Voltage Drift Magnitude at VDD = 5.5V. FIGURE 2-5: Input Offset Voltage Drift Magnitude at VDD = 2.5V. FIGURE 2-6: Quiescent Current vs. Ambient Temperature. FIGURE 2-7: Input Offset Voltage vs. Ambient Temperature. FIGURE 2-8: Open-Loop Gain and Phase vs. Frequency. FIGURE 2-9: Channel-to-Channel Separation (MCP607 and MCP609 only). FIGURE 2-10: Input Offset Voltage vs. Common Mode Input Voltage. FIGURE 2-11: Gain Bandwidth Product, Phase Margin vs. Ambient Temperature. FIGURE 2-12: Input Noise Voltage Density vs. Frequency. FIGURE 2-13: Input Bias Current, Input Offset Current vs. Ambient Temperature. FIGURE 2-14: DC Open-Loop Gain vs. Load Resistance. FIGURE 2-15: CMRR, PSRR vs. Frequency. FIGURE 2-16: Input Bias Current, Input Offset Current vs. Common Mode Input Voltage. FIGURE 2-17: DC Open-Loop Gain vs. Power Supply Voltage. FIGURE 2-18: CMRR, PSRR vs. Ambient Temperature. FIGURE 2-19: Output Voltage Headroom vs. Output Current Magnitude. FIGURE 2-20: Maximum Output Voltage Swing vs. Frequency. FIGURE 2-21: Slew Rate vs. Ambient Temperature. FIGURE 2-22: Output Voltage Headroom vs. Ambient Temperature at RL = 5 kW. FIGURE 2-23: The MCP606/7/8/9 Show No Phase Reversal. FIGURE 2-24: Output Short Circuit Current Magnitude vs. Ambient Temperature. FIGURE 2-25: Large-signal, Non-inverting Pulse Response. FIGURE 2-26: Small-signal, Non-inverting Pulse Response. FIGURE 2-27: Chip Select (CS) Hysteresis (MCP608 only). FIGURE 2-28: Large-signal, Inverting Pulse Response. FIGURE 2-29: Small-signal, Inverting Pulse Response. FIGURE 2-30: Amplifier Output Response Times vs. Chip Select (CS) Pulse (MCP608 only). FIGURE 2-31: Measured Input Current vs. Input Voltage (below VSS). 3.0 Pin Descriptions TABLE 3-1: Pin Function Table 3.1 Analog Outputs 3.2 Analog Inputs 3.3 Chip Select Digital Input 3.4 Power Supply Pins 4.0 Applications Information 4.1 Rail-to-Rail Inputs FIGURE 4-1: Simplified Analog Input ESD Structures. FIGURE 4-2: Protecting the Analog Inputs. FIGURE 4-3: Unity Gain Buffer has a Limited VOUT Range. 4.2 Rail-to-Rail Output 4.3 Capacitive Loads FIGURE 4-4: Output Resistor, RISO stabilizes large capacitive loads. FIGURE 4-5: Recommended RISO Values for Capacitive Loads. 4.4 MCP608 Chip Select 4.5 Supply Bypass 4.6 Unused Op Amps FIGURE 4-6: Unused Op Amps. 4.7 PCB Surface Leakage FIGURE 4-7: Example Guard Ring Layout for Inverting Gain. 4.8 Application Circuits FIGURE 4-8: Low Side Battery Current Sensor. FIGURE 4-9: Photodiode (in Photo-voltaic mode) and Transimpedance Amplifier. FIGURE 4-10: Photodiode (in Photo- conductive mode) and Transimpedance Amplifier. FIGURE 4-11: Two Op Amp Instrumentation Amplifier. FIGURE 4-12: Three Op Amp Instrumentation Amplifier. FIGURE 4-13: Precision Gain with Good Load Isolation. 5.0 Design Aids 5.1 SPICE Macro Model 5.2 FilterLab® Software 5.3 Mindi™ Circuit Designer & Simulator 5.4 Microchip Advanced Part Selector (MAPS) 5.5 Analog Demonstration and Evaluation Boards 5.6 Application Notes 6.0 Packaging Information 6.1 Package Marking Information