Datasheet ZTL431 (Diodes) - 6

HerstellerDiodes
Beschreibung3-terminal adjustable shunt regulators
Seiten / Seite13 / 6 — ZTL431/ZTL432. DC Test Circuits. Notes. Stability Boundary. www.diodes.com
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ZTL431/ZTL432. DC Test Circuits. Notes. Stability Boundary. www.diodes.com

ZTL431/ZTL432 DC Test Circuits Notes Stability Boundary www.diodes.com

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ZTL431/ZTL432 DC Test Circuits Notes
Deviation of reference input voltage, VDEV, is defined as the VMAX maximum variation of the reference input voltage over the full temperature range. The average temperature coefficient of the reference input voltage, VREF is defined as: VREF(ppm/°C) = VDEV × 1,000,000 VREF(T1-T2) V MIN The dynamic output impedance, Rz, is defined as: VDEV = VMAX - VMIN RZ = ΔVZ ΔIZ When the device is programmed with two external resistors, R1 and R2, (Figure 2), the dynamic output impedance of the overall circuit, R'z, is defined as: R'Z = RZ (1 + R1 ) R2
Stability Boundary
The ZTL431 and ZTL432 are stable with a range of capacitive loads. A zone of instability exists as demonstrated in the typical characteristic graph on page 4. The graph shows typical conditions. To ensure reliable stability, a capacitor of 4.7nF or greater is recommended between anode and cathode. ZTL431/ZTL432 6 of 13 January 2021 Document number: DS33263 Rev. 19 - 3
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