Datasheet ADG774 (Analog Devices) - 3

HerstellerAnalog Devices
BeschreibungCMOS 3 V/5 V, Wide Bandwidth Quad 2:1 Mux
Seiten / Seite12 / 3 — ADG774. SINGLE SUPPLY (VDD = 3 V. 10%, GND = 0 V. All specifications TMIN …
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DokumentenspracheEnglisch

ADG774. SINGLE SUPPLY (VDD = 3 V. 10%, GND = 0 V. All specifications TMIN to TMAX unless otherwise noted.). B Version1. –40. C to

ADG774 SINGLE SUPPLY (VDD = 3 V 10%, GND = 0 V All specifications TMIN to TMAX unless otherwise noted.) B Version1 –40 C to

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ADG774 SINGLE SUPPLY (VDD = 3 V 10%, GND = 0 V. All specifications TMIN to TMAX unless otherwise noted.) B Version1 –40 C to –40 C to Parameter +25 C +85 C +125 C Unit Test Conditions/Comments
ANALOG SWITCH Analog Signal Range 0 V to VDD V On Resistance (RON) 4 Ω typ VD = 0 V to VDD, IS = –10 mA 8 9 Ω max On Resistance Match between Channels (RON) 0.15 Ω typ VD = 0 V to VDD, IS = –10 mA 0.5 0.5 Ω max On Resistance Flatness (RFLAT(ON)) 2 Ω typ VD = 0 V to VDD, IS = –10 mA 4 4 Ω max LEAKAGE CURRENTS Source OFF Leakage IS (OFF) ±0.01 nA typ VD = 3 V, VS = 1 V; VD = 1 V, VS = 3 V; ±0.5 ±1 ±1.5 nA max Test Circuit 2 Drain OFF Leakage ID (OFF) ±0.01 nA typ VD = 3 V, VS = 1 V; VD = 1 V, VS = 3 V; ±0.5 ±1 ±1.5 nA max Test Circuit 2 Channel ON Leakage ID, IS (ON) ±0.01 nA typ VD = VS = 3 V; VD = VS = 1 V; Test Circuit 3 ±0.5 ±1 ±1.5 nA max DIGITAL INPUTS Input High Voltage, VINH 2.0 V min Input Low Voltage, VINL 0.8 V max Input Current IINL or IINH 0.001 µA typ VIN = VINL or VINH ±0.5 µA max DYNAMIC CHARACTERISTICS2 tON 8 ns typ RL = 100 Ω, CL = 35 pF, 16 21 ns max VS = +1.5 V; Test Circuit 4 tOFF 5 ns typ RL = 100 Ω, CL = 35 pF, 10 11 ns max VS = +1.5 V; Test Circuit 4 Break-Before-Make Time Delay, tD 5 ns typ RL = 100 Ω, CL = 35 pF, 1 ns min VS1 = VS2 = 3 V; Test Circuit 5 Off Isolation –65 dB typ RL = 50 Ω, f = 10 MHz; Test Circuit 7 Channel-to-Channel Crosstalk –75 dB typ RL = 50 Ω, f = 10 MHz; Test Circuit 8 Bandwidth –3 dB 240 MHz typ RL = 50 Ω; Test Circuit 6 Distortion 2 % typ RL = 50 Ω Charge Injection 3 pC typ CL = 1 nF; Test Circuit 9 CS (OFF) 10 pF typ f = 1 kHz CD (OFF) 20 pF typ f = 1 kHz CD, CS (ON) 30 pF typ f = 1 MHz POWER REQUIREMENTS VDD = +3.3 V Digital Inputs = 0 V or VDD IDD 1 1 µA max 0.001 µA typ IIN 1 1 µA typ VIN = +3 V IO 100 mA max VS/VD = 0 V NOTES 1Temperature range: B Version, –40°C to +125°C. 2Guaranteed by design, not subject to production test. Specifications subject to change without notice.
Table I. Truth Table EN IN D1 D2 D3 D4 Function
1 X Hi-Z Hi-Z Hi-Z Hi-Z DISABLE 0 0 S1A S2A S3A S4A IN = 0 0 1 S1B S2B S3B S4B IN = 1 REV. C –3– Document Outline FEATURES APPLICATIONS FUNCTIONAL BLOCK DIAGRAM GENERAL DESCRIPTION PRODUCT HIGHLIGHTS SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS ORDERING GUIDE PIN CONFIGURATION TERMINOLOGY Typical Performance Characteristics Test Circuits OUTLINE DIMENSIONS Revision History