STP4NK50Z - STP4NK50ZFP - STD4NK50Z - STD4NK50Z-1ABSOLUTE MAXIMUM RATINGSSymbolParameterValueUnitSTD4NK50ZSTP4NK50ZSTP4NK50ZFPSTD4NK50Z-1 VDS Drain-source Voltage (VGS = 0) 500 V VDGR Drain-gate Voltage (RGS = 20 kΩ) 500 V VGS Gate- source Voltage ± 30 V ID Drain Current (continuous) at TC = 25°C 3 3 (*) 3 (*) A ID Drain Current (continuous) at TC = 100°C 1.9 1.9 (*) 1.9 (*) A IDM () Drain Current (pulsed) 12 12 (*) 12 (*) A PTOT Total Dissipation at TC = 25°C 45 20 45 W Derating Factor 0.36 0.16 0.36 W/°C VESD(G-S) Gate source ESD(HBM-C=100pF, R=1.5KΩ) 2800 V dv/dt (1) Peak Diode Recovery voltage slope 4.5 V/ns VISO Insulation Withstand Voltage (DC) - 2500 - V Tj Operating Junction Temperature -55 to 150 °C Tstg Storage Temperature () Pulse width limited by safe operating area (1) ISD ≤3 A, di/dt ≤200A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMAX. (*) Limited only by maximum temperature allowed THERMAL DATADPAKTO-220TO-220FPIPAK Rthj-case Thermal Resistance Junction-case (Max) 2.78 6.25 2.78 °C/W Rthj-amb Thermal Resistance Junction-ambient (Max) 62.5 100 °C/W Tl Maximum Lead Temperature For Soldering Purpose 300 °C AVALANCHE CHARACTERISTICSSymbolParameterMax ValueUnit IAR Avalanche Current, Repetitive or Not-Repetitive 3 A (pulse width limited by Tj max) EAS Single Pulse Avalanche Energy 120 mJ (starting Tj = 25 °C, ID = IAR, VDD = 50 V) GATE-SOURCE ZENER DIODESymbolParameterTest ConditionsMin.Typ.Max.Unit BVGSO Gate-Source Breakdown Igs=± 1mA (Open Drain) 30 V Voltage PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the usage of external components. 2/13