Datasheet ADG508F, ADG509F (Analog Devices) - 10
| Hersteller | Analog Devices |
| Beschreibung | 8-Channel/4-Channel Fault-Protected Analog Multiplexers |
| Seiten / Seite | 20 / 10 — ADG508F/ADG509F. TERMINOLOGY V. CD (Off). CIN. GND. tON (EN). RON. tOFF … |
| Revision | F |
| Dateiformat / Größe | PDF / 289 Kb |
| Dokumentensprache | Englisch |
ADG508F/ADG509F. TERMINOLOGY V. CD (Off). CIN. GND. tON (EN). RON. tOFF (EN). RON Drift. tTRANSITION. ΔRON. tOPEN. IS (Off). VINL. ID (Off). VINH
Modelllinie für dieses Datenblatt
Textversion des Dokuments
ADG508F/ADG509F TERMINOLOGY V CD (Off) DD
Most positive power supply potential. Channel output capacitance for off condition.
V CIN SS
Most negative power supply potential. Digital input capacitance.
GND tON (EN)
Ground (0 V) reference. Delay time between the 50% and 90% points of the digital input and switch on condition.
RON
Ohmic resistance between D and S.
tOFF (EN)
Delay time between the 50% and 90% points of the digital input
RON Drift
and switch off condition. Percentage change in RON when temperature changes by one degree Celsius.
tTRANSITION
Delay time between the 50% and 90% points of the digital
ΔRON
inputs and the switch on condition when switching from ΔRON represents the difference between the RON of any two one address state to another. channels as a percentage of the maximum RON of those two channels.
tOPEN
Off time measured between 80% points of both switches when
IS (Off)
switching from one address state to another. Source leakage current when the switch is off.
VINL ID (Off)
Maximum input voltage for Logic 0. Drain leakage current when the switch is off.
VINH ID, IS (On)
Minimum input voltage for Logic 1. Channel leakage current when the switch is on.
IINL (IINH) IS (Fault—Power Supplies On)
Input current of the digital input. Source leakage current when exposed to an overvoltage condition.
Off Isolation
A measure of unwanted signal coupling through an off channel.
ID (Fault—Power Supplies On)
Drain leakage current when exposed to an overvoltage
Charge Injection
condition. A measure of the glitch impulse transferred from the digital input to the analog output during switching.
IS (Fault—Power Supplies Off)
Source leakage current with power supplies off.
IDD
Positive supply current.
VD (VS)
Analog Voltage on Terminals D, S.
ISS
Negative supply current.
CS (Off)
Channel input capacitance for off condition. Rev. F | Page 10 of 20 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAMS PRODUCT HIGHLIGHTS TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS DUAL SUPPLY TRUTH TABLES ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS TERMINOLOGY THEORY OF OPERATION TEST CIRCUITS OUTLINE DIMENSIONS ORDERING GUIDE
Most positive power supply potential. Channel output capacitance for off condition.
V CIN SS
Most negative power supply potential. Digital input capacitance.
GND tON (EN)
Ground (0 V) reference. Delay time between the 50% and 90% points of the digital input and switch on condition.
RON
Ohmic resistance between D and S.
tOFF (EN)
Delay time between the 50% and 90% points of the digital input
RON Drift
and switch off condition. Percentage change in RON when temperature changes by one degree Celsius.
tTRANSITION
Delay time between the 50% and 90% points of the digital
ΔRON
inputs and the switch on condition when switching from ΔRON represents the difference between the RON of any two one address state to another. channels as a percentage of the maximum RON of those two channels.
tOPEN
Off time measured between 80% points of both switches when
IS (Off)
switching from one address state to another. Source leakage current when the switch is off.
VINL ID (Off)
Maximum input voltage for Logic 0. Drain leakage current when the switch is off.
VINH ID, IS (On)
Minimum input voltage for Logic 1. Channel leakage current when the switch is on.
IINL (IINH) IS (Fault—Power Supplies On)
Input current of the digital input. Source leakage current when exposed to an overvoltage condition.
Off Isolation
A measure of unwanted signal coupling through an off channel.
ID (Fault—Power Supplies On)
Drain leakage current when exposed to an overvoltage
Charge Injection
condition. A measure of the glitch impulse transferred from the digital input to the analog output during switching.
IS (Fault—Power Supplies Off)
Source leakage current with power supplies off.
IDD
Positive supply current.
VD (VS)
Analog Voltage on Terminals D, S.
ISS
Negative supply current.
CS (Off)
Channel input capacitance for off condition. Rev. F | Page 10 of 20 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAMS PRODUCT HIGHLIGHTS TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS DUAL SUPPLY TRUTH TABLES ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS TERMINOLOGY THEORY OF OPERATION TEST CIRCUITS OUTLINE DIMENSIONS ORDERING GUIDE