Datasheet ADG725, ADG731 (Analog Devices) - 4
| Hersteller | Analog Devices |
| Beschreibung | 16-/32-Channel, Serially Controlled 4 1.8 V to 5.5 V, 2.5 V, Analog Multiplexers |
| Seiten / Seite | 17 / 4 — ADG725/ADG731. DUAL-SUPPLY SPECIFICATIONS1 (VDD = +2.5 V. 10%, VSS = –2.5 … |
| Revision | B |
| Dateiformat / Größe | PDF / 264 Kb |
| Dokumentensprache | Englisch |
ADG725/ADG731. DUAL-SUPPLY SPECIFICATIONS1 (VDD = +2.5 V. 10%, VSS = –2.5 V. 10%, GND = 0 V,. unless otherwise noted.). B Version
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ADG725/ADG731 DUAL-SUPPLY SPECIFICATIONS1 (VDD = +2.5 V 10%, VSS = –2.5 V 10%, GND = 0 V, unless otherwise noted.) B Version Parameter +25
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C –40
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C to +85
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C Unit Test Conditions/Comments
ANALOG SWITCH Analog Signal Range VSS to VDD V On Resistance (RON) 4 Ω typ VS = VSS to VDD, IDS = 10 mA; 5.5 6 Ω max Test Circuit 1 On Resistance Match Between 0.3 Ω typ VS = VSS to VDD, IDS = 10 mA Channels (ΔRON) 0.8 Ω max On Resistance Flatness (RFLAT(ON)) 0.5 Ω typ VS = VSS to VDD, IDS = 10 mA 1 Ω max LEAKAGE CURRENTS VDD = +2.75 V, VSS = –2.75 V Source OFF Leakage IS (OFF) ±0.01 nA typ VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V; ±0.25 ±0.5 nA max Test Circuit 2 Drain OFF Leakage ID (OFF) ±0.05 nA typ VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V; ADG725 ±0.5 ±2.5 nA max Test Circuit 3 ADG731 ±1 ±5 nA max Channel ON Leakage ID, IS (ON) ±0.01 nA typ VS = VD = +2.25 V/–1.25 V; Test Circuit 4 ADG725 ±0.5 ±2.5 nA max ADG731 ±1 ±5 nA max DIGITAL INPUTS Input High Voltage, VINH 1.7 V min Input Low Voltage, VINL 0.7 V max Input Current IINL or IINH 0.005 μA typ VIN = VINL or VINH ±0.5 μA max CIN, Digital Input Capacitance 5 pF typ DYNAMIC CHARACTERISTICS2 tTRANSITION 55 ns typ RL = 300 Ω, CL = 35 pF; Test Circuit 5 75 84 ns max VS1 = 1.5 V/0 V, VS32 = 0 V/1.5 V Break-Before-Make Time Delay, tD 15 ns typ RL = 300 Ω, CL = 35 pF 1 ns min VS = 1.5 V; Test Circuit 6 Charge Injection 1 pC typ VS = 0 V, RS = 0 Ω, CL = 1 nF; Test Circuit 7 Off Isolation –72 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; Test Circuit 8 Channel-to-Channel Crosstalk –72 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; Test Circuit 9 –3 dB Bandwidth ADG725 34 MHz typ RL = 50 Ω, CL = 5 pF; Test Circuit 10 ADG731 18 MHz typ CS (OFF) 13 pF typ CD (OFF) ADG725 130 pF typ f = 1 MHz ADG731 260 pF typ f = 1 MHz CD, CS (ON) ADG725 150 pF typ f = 1 MHz ADG731 300 pF typ f = 1 MHz POWER REQUIREMENTS VDD = +2.75 V IDD 10 μA typ Digital Inputs = 0 V or 2.75 V 20 μA max ISS 10 μA typ VSS = –2.75 V 20 μA max Digital Inputs = 0 V or 2.75 V NOTES 1Temperature range is as follows: B Version: –40°C to +85°C. 2Guaranteed by design, not subject to production test. Specifications subject to change without notice. –4– REV. B
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C –40
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C to +85
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C Unit Test Conditions/Comments
ANALOG SWITCH Analog Signal Range VSS to VDD V On Resistance (RON) 4 Ω typ VS = VSS to VDD, IDS = 10 mA; 5.5 6 Ω max Test Circuit 1 On Resistance Match Between 0.3 Ω typ VS = VSS to VDD, IDS = 10 mA Channels (ΔRON) 0.8 Ω max On Resistance Flatness (RFLAT(ON)) 0.5 Ω typ VS = VSS to VDD, IDS = 10 mA 1 Ω max LEAKAGE CURRENTS VDD = +2.75 V, VSS = –2.75 V Source OFF Leakage IS (OFF) ±0.01 nA typ VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V; ±0.25 ±0.5 nA max Test Circuit 2 Drain OFF Leakage ID (OFF) ±0.05 nA typ VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V; ADG725 ±0.5 ±2.5 nA max Test Circuit 3 ADG731 ±1 ±5 nA max Channel ON Leakage ID, IS (ON) ±0.01 nA typ VS = VD = +2.25 V/–1.25 V; Test Circuit 4 ADG725 ±0.5 ±2.5 nA max ADG731 ±1 ±5 nA max DIGITAL INPUTS Input High Voltage, VINH 1.7 V min Input Low Voltage, VINL 0.7 V max Input Current IINL or IINH 0.005 μA typ VIN = VINL or VINH ±0.5 μA max CIN, Digital Input Capacitance 5 pF typ DYNAMIC CHARACTERISTICS2 tTRANSITION 55 ns typ RL = 300 Ω, CL = 35 pF; Test Circuit 5 75 84 ns max VS1 = 1.5 V/0 V, VS32 = 0 V/1.5 V Break-Before-Make Time Delay, tD 15 ns typ RL = 300 Ω, CL = 35 pF 1 ns min VS = 1.5 V; Test Circuit 6 Charge Injection 1 pC typ VS = 0 V, RS = 0 Ω, CL = 1 nF; Test Circuit 7 Off Isolation –72 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; Test Circuit 8 Channel-to-Channel Crosstalk –72 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; Test Circuit 9 –3 dB Bandwidth ADG725 34 MHz typ RL = 50 Ω, CL = 5 pF; Test Circuit 10 ADG731 18 MHz typ CS (OFF) 13 pF typ CD (OFF) ADG725 130 pF typ f = 1 MHz ADG731 260 pF typ f = 1 MHz CD, CS (ON) ADG725 150 pF typ f = 1 MHz ADG731 300 pF typ f = 1 MHz POWER REQUIREMENTS VDD = +2.75 V IDD 10 μA typ Digital Inputs = 0 V or 2.75 V 20 μA max ISS 10 μA typ VSS = –2.75 V 20 μA max Digital Inputs = 0 V or 2.75 V NOTES 1Temperature range is as follows: B Version: –40°C to +85°C. 2Guaranteed by design, not subject to production test. Specifications subject to change without notice. –4– REV. B