OP27 Data Sheet TABLE OF CONTENTS Features .. 1 Typical Performance Characteristics ..8 General Description ... 1 Applications Information .. 14 Pin Configurations ... 1 Offset Voltage Adjustment .. 14 Functional Block Diagram .. 1 Noise Measurements .. 14 Revision History ... 2 Unity-Gain Buffer Applications ... 14 Specifications ... 4 Comments On Noise ... 15 Electrical Characteristics ... 4 Audio Applications .. 16 Typical Electrical Characteristics ... 6 References .. 18 Absolute Maximum Ratings .. 7 Outline Dimensions ... 19 Thermal Resistance .. 7 Ordering Guide .. 21 ESD Caution .. 7 REVISION HISTORY 10/15—Rev. G to Rev. H1/03—Rev. B to Rev. C Changes to Features Section and General Description Section . 1 Edits to Pin Connections .. 1 Changes to Note 1, Ordering Guide . 21 Edits to General Description ... 1 Edits to Die Characteristics .. 5 3/15—Rev. F to Rev. G Edits to Absolute Maximum Ratings .. 7 Changes to General Description Section .. 3 Updated Outline Dimensions ... 16 Changes to Figure 31 .. 12 Edits to Figure 8 .. 14 Changes to Applications Information Section and Output Edits to Outline Dimensions... 16 Voltage Adjustment Section .. 14 Updated Outline Dimensions ... 19 9/01—Rev. 0 to Rev. A Changes to Ordering Guide .. 21 Edits to Ordering Information .. 1 Edits to Pin Connections .. 1 5/06—Rev. E to Rev. F Edits to Absolute Maximum Ratings .. 2 Removed References to 745 .. Universal Edits to Package Type ... 2 Updated 741 to AD741 .. Universal Edits to Electrical Characteristics .. 2, 3 Changes to Ordering Guide .. 20 Edits to Wafer Test Limits .. 4 Deleted Typical Electrical Characteristics.. 4 12/05—Rev. D to Rev. E Edits to Burn-In Circuit Figure ... 7 Edits to Figure 2 .. 1 Edits to Application Information .. 8 9/05—Rev. C to Rev. D Updated Format .. Universal Changes to Table 1 .. 4 Removed Die Characteristics Figure ... 5 Removed Wafer Test Limits Table .. 5 Changes to Table 5 .. 7 Changes to Comments on Noise Section .. 15 Changes to Ordering Guide .. 24 Rev. H | Page 2 of 21