Datasheet OP37 (Analog Devices) - 3

OP37 SPECIFICATIONS ( VS = 15 V, TA = 25 C, unless otherwise noted.) OP37A/E OP37F OP37G Parameter Symbol Conditions Min Typ Max Min Typ Max Min Typ Max Unit
Input Offset Voltage VOS Note 1 10 25 20 60 30 100 mV Long-Term Stability VOS/Time Notes 2, 3 0.2 1.0 0.3 1.5 0.4 2.0 mV/Mo Input Offset Current IOS 7 35 9 50 12 75 nA Input Bias Current IB ±10 ±40 ±12 ±55 ±15 ±80 nA Input Noise Voltage enp-p 1 Hz to 10 Hz3, 5 0.08 0.18 0.08 0.18 0.09 0.25 mV p-p Input Noise Voltage Density en fO = 10 Hz3 3.5 5.5 3.5 5.5 3.8 8.0 fO = 30 Hz3 3.1 4.5 3.1 4.5 3.3 5.6 nV/÷ Hz fO = 1000 Hz3 3.0 3.8 3.0 3.8 3.2 4.5 Input Noise Current Density iN fO = 10 Hz3, 6 1.7 4.0 1.7 4.0 1.7 fO = 30 Hz3, 6 1.0 2.3 1.0 2.3 1.0 pA/÷ Hz fO = 1000 Hz3, 6 0.4 0.6 0.4 0.6 0.4 0.6 Input Resistance Differential Mode RIN Note 7 1.3 6 0.9 4 5 0.7 4 MW Input Resistance Common Mode RINCM 3 2.5 2 GW Input Voltage Range IVR ±11 ±12.3 ±11 ±12.3 ±11 ±12.3 V Common Mode Rejection Ratio CMRR VCM = ± 11 V 114 126 106 123 100 120 dB Power Supply Rejection Ratio PSSR VS = ± 4 V 1 10 1 10 2 20 mV/ V to ±18 V Large Signal Voltage Gain AVO RL ≥ 2 kW, VO = ± 10 V 1000 1800 1000 1800 700 1500 V/mV RL ≥ 1 kW, Vo = ± 10 V 800 1500 800 1500 400 1500 V/mV R ≥ L 600 W, VO = ± 1 V, VS ±44 250 700 250 700 200 500 V/mV Output Voltage Swing V ≥ O RL 2 kW ±12.0 ±13.8 ±12.0 ±13.8 ±11.5 ±13.5 V RL ≥ 600 W ±10 ±11.5 ±10 ±11.5 ±10 ±11.5 V Slew Rate SR R ≥ L 2k W4 11 17 11 17 11 17 V/ms Gain Bandwidth Product GBW fO = 10 kHz4 45 63 45 63 45 63 MHz fO = 1 MHz 40 40 40 MHz Open-Loop Output Resistance RO VO = 0, IO = 0 70 70 70 W Power Consumption Pd VO = 0 90 140 90 140 100 170 mW Offset Adjustment Range RP = 10 kW ±4 ±4 ±4 mV NOTES 1Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power. A/E grades guaranteed fully warmed up. 2Long term input offset voltage stability refers to the average trend line of V OS vs. Time over extended periods after the first 30 days of operation. Excluding the initial hour of operation, changes in VOS during the first 30 days are typically 2.5 mV—refer to typical performance curve. 3Sample tested. 4Guaranteed by design. 5See test circuit and frequency response curve for 0.1 Hz to 10 Hz tester. 6See test circuit for current noise measurement. 7Guaranteed by input bias current. REV. B –3– Document Outline FEATURES GENERAL DESCRIPTION PIN CONNECTIONS SIMPLIFIED SCHEMATIC ABSOLUTE MAXIMUM RATINGS ORDERING GUIDE SPECIFICATIONS BINDING DIAGRAM Wafer Test Limits Typical Electrical Characteristics Typical Performance Characteristics APPLICATIONS INFORMATION Offset Voltage Adjustment Noise Measurements Optimizing Linearity Instrumentation Amplifier Comments on Noise Audio Applications OUTLINE DIMENSIONS Revision History