OP470 Figure 6 shows peak-to-peak noise versus source resistance over Table I. the 0.1 Hz to 10 Hz range. Once again, at low values of RS, the voltage noise of the OP470 is the major contributor to peak-to-peak Device noise with current noise the major contributor as R SourceImpedanceComments S increases. The crossover point between the OP470 and the OP400 for Strain gage <500 W Typically used in peak-to-peak noise is at RS = 17 kW. low frequency applications. The OP471 is a higher speed version of the OP470, with a slew Magnetic <1500 W Low IB very important to reduce rate of 8 V/ms. Noise of the OP471 is only slightly higher than tapehead self-magnetization problems the OP470. Like the OP470, the OP471 is unity-gain stable. when direct coupling is used. OP470 IB can be neglected. 1000OP11 Magnetic <1500 W Similar need for low IB in direct phonograph coupled applications. OP470 OP400 cartridges will not introduce any self- magnetization problem. OP471 Linear variable <1500 W Used in rugged servo-feedback 100 differential applications. Bandwidth of OP470 transformer interest is 400 Hz to 5 kHz. O-PEAK NOISE – nV/ HzRESISTOR For further information regarding noise calculations, see “Minimization of Noise NOISE ONLY in Op Amp Applications,” Application Note AN-15. PEAK-TNOISE MEASUREMENTS— PEAK-TO-PEAK VOLTAGE NOISE101001k10k100k The circuit of Figure 7 is a test setup for measuring peak-to-peak RS – SOURCE RESISTANCE – voltage noise. To measure the 200 nV peak-to-peak noise speci- Figure 6. Peak-To-Peak Noise (0.1 Hz to 10 Hz) vs. Source fication of the OP470 in the 0.1 Hz to 10 Hz range, the following Resistance (Includes Resistor Noise) precautions must be observed: For reference, typical source resistances of some signal sources 1. The device must be warmed up for at least five minutes. As are listed in Table I. shown in the warm-up drift curve, the offset voltage typi- cally changes 5 mV due to increasing chip temperature after power-up. In the 10-second measurement interval, these temperature-induced effects can exceed tens of nanovolts. 2. For similar reasons, the device must be well-shielded from air currents. Shielding also minimizes thermocouple effects. 3. Sudden motion in the vicinity of the device can also “feedthrough” to increase the observed noise. R31.24kR1 5OP470C1R2DUT2F5OP27EC4R60.22FR5600k909R10R1165.4k65.4kR4D1D2OP15ER142001N41481N4148C34.99keR90.22FOP15EOUT306kC5R131F5.9kR8 10kC2R120.032F10kGAIN = 50,000 VS =5V Figure 7. Peak-To-Peak Voltage Noise Test Circuit (0.1 Hz to 10 Hz) –10– REV. B Document Outline FEATURES GENERAL DESCRIPTION PIN CONNECTIONS SIMPLIFIED SCHEMATIC SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS ORDERING GUIDE Typical Performance Characteristics APPLICATIONS INFORMATION Voltage and Current Noise TOTAL NOISE AND SOURCE RESISTANCE NOISE MEASUREMENTS— PEAK-TO-PEAK VOLTAGE NOISE NOISE MEASUREMENT—NOISE VOLTAGE DENSITY NOISE MEASUREMENT—CURRENT NOISE DENSITY CAPACITIVE LOAD DRIVING AND POWER SUPPLY CONSIDERATIONS UNITY-GAIN BUFFER APPLICATIONS 50k APPLICATIONS Low Noise Amplifier DIGITAL PANNING CONTROL SQUELCH AMPLIFIER FIVE-BAND LOW-NOISE STEREO GRAPHIC EQUALIZER OUTLINE DIMENSIONS Revision History