Datasheet TLP3107A (Toshiba) - 2

HerstellerToshiba
BeschreibungPhotocouplers Photorelay
Seiten / Seite9 / 2 — TLP3107A. 5. Internal. Circuit. 6. Absolute. Maximum. Ratings. (Note). …
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TLP3107A. 5. Internal. Circuit. 6. Absolute. Maximum. Ratings. (Note). (Unless. otherwise. specified,. Ta. =. 25. ). Characteristics. Symbol. Note. Rating

TLP3107A 5 Internal Circuit 6 Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 ) Characteristics Symbol Note Rating

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TLP3107A 5. Internal Circuit 6. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 ) Characteristics Symbol Note Rating Unit LED Input forward current IF 30 mA Input forward current derating (Ta ≥ 25 ) ∆IF/∆Ta -0.3 mA/ Input forward current (pulsed) (100 µs pulse, 100 pps) IFP 1 A Input reverse voltage VR 6 V Input power dissipation PD 50 mW Input power dissipation derating (Ta ≥ 25 ) ∆PD/∆Ta -0.5 mW/ Junction temperature Tj 125 Detector OFF-state output terminal voltage VOFF 60 V ON-state current(A connection) ION (Note 1) 4 A ON-state current(B connection) 4 ON-state current(C connection) 8 ON-state current derating(A connection) (Ta ≥ 25 ) ∆ION/∆Ta (Note 1) -40 mA/ ON-state current derating(B connection) (Ta ≥ 25 ) -40 ON-state current derating(C connection) (Ta ≥ 25 ) -80 ON-state current (pulsed) (t = 100 ms, Duty = 1/10) IONP 12 A Output power dissipation PO 400 mW Output power dissipation derating (Ta ≥ 25 ) ∆PO/∆Ta -4.0 mW/ Junction temperature Tj 125 Common Storage temperature Tstg -55 to 125 Operating temperature Topr -40 to 110 Lead soldering temperature (10 s) Tsol 260 Isolation voltage (AC, 60 s, R.H. ≤ 60%) BVS (Note 2) 1500 Vrms Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: For an application circuit example, see Chapter 12.2. Note 2: This device is considered as a two-terminal device: Pins 1, 2 and 3 are shorted together, and pins 4, 5 and 6 are shorted together. ©2018-2019 2 2019-12-26 Toshiba Electronic Devices & Storage Corporation Rev.2.0