Datasheet RH118 (Analog Devices)

HerstellerAnalog Devices
BeschreibungPrecision, High Speed Operational Amplifier
Seiten / Seite4 / 1 — DESCRIPTION. ABSOLUTE MAXIMUM RATINGS. BURN-IN CIRCUIT (Each Amplifier). …
RevisionC
Dateiformat / GrößePDF / 671 Kb
DokumentenspracheEnglisch

DESCRIPTION. ABSOLUTE MAXIMUM RATINGS. BURN-IN CIRCUIT (Each Amplifier). PACKAGE/ORDER INFORMATION

Datasheet RH118 Analog Devices, Revision: C

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RH118 Precision, High Speed Operational Amplifier
DESCRIPTION ABSOLUTE MAXIMUM RATINGS
The RH®118 is a precision, high speed operational ampli- fier which offers wide bandwidth and high slew rate. Supply Voltage ... ±20V Unlike many wideband amplifiers, the RH118 is unity- Differential Input Current (Note 1) .. ±10mA gain stable and has a slew rate of 50V/µs. Input Voltage (Note 2) ... ±20V Output Short-Circuit Duration .. Indefinite The wafer lots are processed to Analog Devices’ in-house Operating Temperature Range ..–55°C to 125°C Class S flow to yield circuits usable in stringent military Storage Temperature Range ..–65°C to 150°C applications. Lead Temperature (Soldering, 10 sec) ...300°C All registered trademarks and trademarks are the property of their respective owners. Protected by U.S. patents, including XXXXX, XXXXX.
BURN-IN CIRCUIT (Each Amplifier)
10k 20V 20V 2 – 7 2 – 7
OR
6 200Ω 6 3 + 249k 3 3V + 4 4 301Ω 10k –20V –20V RH118 BI
PACKAGE/ORDER INFORMATION
TOP VIEW COMP2 TOP VIEW TOP VIEW 8 COMP1 1 7 V+ COMP1 1 8 COMP2 NC 1 10 NC – –IN 2 7 V+ COMP1 2 9 COMP2 –IN 2 6 + OUT –INPUT 3 8 V+ +IN 3 6 OUT +IN 3 5 COMP3 +INPUT 4 7 OUTPUT V– 4 5 COMP3 4 V– 5 6 COMP3 V– (CASE) J8 PACKAGE H PACKAGE 8-LEAD CERDIP W PACKAGE 8-LEAD TO-5 METAL CAN 10-LEAD CERPAC
Note: Obsolete Packages-For Reference Only
I.D.No.66-11-0118 Rev. C Document Feedback For more information www.analog.com 1 Document Outline Description Burn-In Circuit Package/Order Information Absolute Maximum Ratings Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Electrical Characteristics Total Dose Bias Circuit Table 2: Electrical Test Requirements Revision History