Datasheet RH1498M (Analog Devices) - 5
| Hersteller | Analog Devices |
| Beschreibung | 10MHz, 6V/µs, Dual Rail-to-Rail Input and Output Precision C-Load Op Amp |
| Seiten / Seite | 8 / 5 — TABLE 2A: ELECTRICAL CHARACTERISTICS. (Postirradiation) VS = 5V; VCM = … |
| Dateiformat / Größe | PDF / 130 Kb |
| Dokumentensprache | Englisch |
TABLE 2A: ELECTRICAL CHARACTERISTICS. (Postirradiation) VS = 5V; VCM = half supply, TA = 25°C, unless otherwise noted
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RH1498M
TABLE 2A: ELECTRICAL CHARACTERISTICS (Postirradiation) VS = 5V; VCM = half supply, TA = 25°C, unless otherwise noted. 10Krad(Si) 20Krad(Si) 50Krad(Si) 100Krad(Si) 200Krad(Si) SYMBOL PARAMETER CONDITIONS NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS
PSRR Match VS = 4.5V to 12V, 3 82 82 82 82 82 dB (Channel-to-Channel) VCM = VO = 0.5V VOUT Output Voltage No Load 60 60 60 60 60 mV Swing Low ISINK = 1mA 4 100 100 100 100 100 mV ISINK = 2.5mA 200 200 200 200 200 mV Output Voltage No Load 20 20 20 20 20 mV Swing High ISOURCE = 1mA 4 150 150 150 150 150 mV ISOURCE = 2.5mA 250 250 250 250 250 mV ISC Short-Circuit Current ±8 ±8 ±8 ±8 ±8 mA IS Supply Current 2.2 2.2 2.2 2.2 2.2 mA SR Slew Rate VS = ±2.5V, AV = –1, 2 2 2 2 2 V/µs RL = 10k, VO = ±2V, Measure at VO = ±1V
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 3:
Matching parameters are the difference between amplifiers may cause permanent damage to the device. Exposure to any Absolute A and B. Maximum Rating condition for extended periods may affect device
Note 4:
Output voltage swings are measured between the output and reliability and lifetime. power supply rails.
Note 2:
A heat sink may be required to keep the junction temperature below this absolute maximum rating when the output is shorted indefinitely.
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after Group B and D for Class S, and 1,2,3 burn-in divided by the total number of devices submitted for burn-in in End Point Electrical Parameters (Method 5005) that lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
40pF 5k 15V – 5k 8V + –15V RH1498 TC rh1498mff For more information www.linear.com/RH1498M 5 Document Outline Description Absolute Maximum Ratings Burn-In Circuit Package Information Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Table 2: Electrical Characteristics Table 2A: Electrical Characteristics TYPICAL PERFORMANCE CHARACTERISTICS
TABLE 2A: ELECTRICAL CHARACTERISTICS (Postirradiation) VS = 5V; VCM = half supply, TA = 25°C, unless otherwise noted. 10Krad(Si) 20Krad(Si) 50Krad(Si) 100Krad(Si) 200Krad(Si) SYMBOL PARAMETER CONDITIONS NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS
PSRR Match VS = 4.5V to 12V, 3 82 82 82 82 82 dB (Channel-to-Channel) VCM = VO = 0.5V VOUT Output Voltage No Load 60 60 60 60 60 mV Swing Low ISINK = 1mA 4 100 100 100 100 100 mV ISINK = 2.5mA 200 200 200 200 200 mV Output Voltage No Load 20 20 20 20 20 mV Swing High ISOURCE = 1mA 4 150 150 150 150 150 mV ISOURCE = 2.5mA 250 250 250 250 250 mV ISC Short-Circuit Current ±8 ±8 ±8 ±8 ±8 mA IS Supply Current 2.2 2.2 2.2 2.2 2.2 mA SR Slew Rate VS = ±2.5V, AV = –1, 2 2 2 2 2 V/µs RL = 10k, VO = ±2V, Measure at VO = ±1V
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 3:
Matching parameters are the difference between amplifiers may cause permanent damage to the device. Exposure to any Absolute A and B. Maximum Rating condition for extended periods may affect device
Note 4:
Output voltage swings are measured between the output and reliability and lifetime. power supply rails.
Note 2:
A heat sink may be required to keep the junction temperature below this absolute maximum rating when the output is shorted indefinitely.
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after Group B and D for Class S, and 1,2,3 burn-in divided by the total number of devices submitted for burn-in in End Point Electrical Parameters (Method 5005) that lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
40pF 5k 15V – 5k 8V + –15V RH1498 TC rh1498mff For more information www.linear.com/RH1498M 5 Document Outline Description Absolute Maximum Ratings Burn-In Circuit Package Information Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Table 2: Electrical Characteristics Table 2A: Electrical Characteristics TYPICAL PERFORMANCE CHARACTERISTICS