Datasheet RH1499M (Analog Devices) - 5
| Hersteller | Analog Devices |
| Beschreibung | 10MHz, 6V/µs, Quad Rail-to-Rail Input and Output Precision C-Load Op Amp |
| Seiten / Seite | 8 / 5 — TABLE 2A: ELECTRICAL CHARACTERISTICS. (Postirradiation) VS = 5V; VCM = … |
| Dateiformat / Größe | PDF / 181 Kb |
| Dokumentensprache | Englisch |
TABLE 2A: ELECTRICAL CHARACTERISTICS. (Postirradiation) VS = 5V; VCM = half supply, TA = 25°C, unless otherwise noted
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RH1499M
TABLE 2A: ELECTRICAL CHARACTERISTICS (Postirradiation) VS = 5V; VCM = half supply, TA = 25°C, unless otherwise noted. 10Krad (Si) 20Krad (Si) 50Krad (Si) 100Krad (Si) 200Krad (Si) SYMBOL PARAMETER CONDITIONS NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS
CMRR Match VCM = V+ to V– 3 70 70 70 70 70 dB (Channel-to-Channel) PSRR Power Supply VS = 4.5V to 12V, 88 88 88 88 88 dB Rejection Ratio VCM = VO = 0.5V PSRR Match VS = 4.5V to 12V, 3 82 82 82 82 82 dB (Channel-to-Channel) VCM = VO = 0.5V VOUT Output Voltage No Load 60 60 60 60 60 mV Swing Low ISINK = 1mA 4 100 100 100 100 100 mV ISINK = 2.5mA 200 200 200 200 200 mV Output Voltage No Load 20 20 20 20 20 mV Swing High ISOURCE = 1mA 4 150 150 150 150 150 mV ISOURCE = 2.5mA 250 250 250 250 250 mV ISC Short-Circuit Current ±8 ±8 ±8 ±8 ±8 mA IS Supply Current 2.2 2.2 2.2 2.2 2.2 mA SR Slew Rate VS = ±2.5V, AV = –1, 2 2 2 2 2 V/µs RL = 10k, VO = ±2V, Measure at VO = ±1V
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 3:
Matching parameters are the difference between amplifiers A and may cause permanent damage to the device. Exposure to any Absolute D and between B and C. Maximum Rating condition for extended periods may affect device
Note 4:
Output voltage swings are measured between the output and reliability and lifetime. power supply rails.
Note 2:
A heat sink may be required to keep the junction temperature below this absolute maximum rating when the output is shorted indefinitely.
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after Group B and D for Class S, and 1,2,3 burn-in divided by the total number of devices submitted for burn-in in End Point Electrical Parameters (Method 5005) that lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
40pF 5k 15V – 5k 8V + –15V RH1499 TC rh1499mfg For more information www.linear.com/RH1499M 5 Document Outline Description Absolute Maximum Ratings Burn-In Circuit Package Information Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Table 2: Electrical Characteristics Table 2A: Electrical Characteristics Table 2: Electrical Test Requirements Total Dose Bias Circuit Typical Performance Characteristics
TABLE 2A: ELECTRICAL CHARACTERISTICS (Postirradiation) VS = 5V; VCM = half supply, TA = 25°C, unless otherwise noted. 10Krad (Si) 20Krad (Si) 50Krad (Si) 100Krad (Si) 200Krad (Si) SYMBOL PARAMETER CONDITIONS NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS
CMRR Match VCM = V+ to V– 3 70 70 70 70 70 dB (Channel-to-Channel) PSRR Power Supply VS = 4.5V to 12V, 88 88 88 88 88 dB Rejection Ratio VCM = VO = 0.5V PSRR Match VS = 4.5V to 12V, 3 82 82 82 82 82 dB (Channel-to-Channel) VCM = VO = 0.5V VOUT Output Voltage No Load 60 60 60 60 60 mV Swing Low ISINK = 1mA 4 100 100 100 100 100 mV ISINK = 2.5mA 200 200 200 200 200 mV Output Voltage No Load 20 20 20 20 20 mV Swing High ISOURCE = 1mA 4 150 150 150 150 150 mV ISOURCE = 2.5mA 250 250 250 250 250 mV ISC Short-Circuit Current ±8 ±8 ±8 ±8 ±8 mA IS Supply Current 2.2 2.2 2.2 2.2 2.2 mA SR Slew Rate VS = ±2.5V, AV = –1, 2 2 2 2 2 V/µs RL = 10k, VO = ±2V, Measure at VO = ±1V
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 3:
Matching parameters are the difference between amplifiers A and may cause permanent damage to the device. Exposure to any Absolute D and between B and C. Maximum Rating condition for extended periods may affect device
Note 4:
Output voltage swings are measured between the output and reliability and lifetime. power supply rails.
Note 2:
A heat sink may be required to keep the junction temperature below this absolute maximum rating when the output is shorted indefinitely.
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after Group B and D for Class S, and 1,2,3 burn-in divided by the total number of devices submitted for burn-in in End Point Electrical Parameters (Method 5005) that lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
40pF 5k 15V – 5k 8V + –15V RH1499 TC rh1499mfg For more information www.linear.com/RH1499M 5 Document Outline Description Absolute Maximum Ratings Burn-In Circuit Package Information Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Table 2: Electrical Characteristics Table 2A: Electrical Characteristics Table 2: Electrical Test Requirements Total Dose Bias Circuit Typical Performance Characteristics