Datasheet LTC6652 (Analog Devices) - 4
| Hersteller | Analog Devices |
| Beschreibung | Precision Low Drift Low Noise Buffered Reference |
| Seiten / Seite | 20 / 4 — e lectrical characteristics The. denotes the specifications which apply … |
| Dateiformat / Größe | PDF / 561 Kb |
| Dokumentensprache | Englisch |
e lectrical characteristics The. denotes the specifications which apply over the full operating
Modelllinie für dieses Datenblatt
- LTC6652AHLS8-2.5#PBF LTC6652AHLS8-4.096#PBF LTC6652AHLS8-5#PBF LTC6652AHMS8-1.25#PBF LTC6652AHMS8-1.25#TRPBF LTC6652AHMS8-2.048#PBF LTC6652AHMS8-2.048#TRPBF LTC6652AHMS8-2.5#PBF LTC6652AHMS8-2.5#TRPBF LTC6652AHMS8-3#PBF LTC6652AHMS8-3#TRPBF LTC6652AHMS8-3.3#PBF LTC6652AHMS8-3.3#TRPBF LTC6652AHMS8-4.096#PBF LTC6652AHMS8-4.096#TRPBF LTC6652AHMS8-5#PBF LTC6652AHMS8-5#TRPBF LTC6652BHLS8-2.5#PBF LTC6652BHLS8-4.096#PBF LTC6652BHLS8-5#PBF LTC6652BHMS8-1.25#PBF LTC6652BHMS8-1.25#TRPBF LTC6652BHMS8-2.048#PBF LTC6652BHMS8-2.048#TRPBF LTC6652BHMS8-2.5#PBF LTC6652BHMS8-2.5#TRPBF LTC6652BHMS8-3#PBF LTC6652BHMS8-3#TRPBF LTC6652BHMS8-3.3#PBF LTC6652BHMS8-3.3#TRPBF LTC6652BHMS8-4.096#PBF LTC6652BHMS8-4.096#TRPBF LTC6652BHMS8-5#PBF LTC6652BHMS8-5#TRPBF
Textversion des Dokuments
LTC6652
e lectrical characteristics The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C, VIN = VOUT + 0.5V, unless otherwise noted. PARAMETER CONDITIONS MIN TYP MAX UNITS
Load Regulation (Note 4) ISOURCE = 5mA, LTC6652-1.25, LTC6652-2.048, 20 75 ppm/mA LTC6652-2.5, LTC6652-3, LTC6652-3.3, l 200 ppm/mA LTC6652-4.096, LTC6652-5 ISINK = 1mA, LTC6652-1.25, LTC6652-2.048 80 250 ppm/mA l 600 ppm/mA ISINK = 5mA, LTC6652-2.5, LTC6652-3, 50 150 ppm/mA LTC6652-3.3, LTC6652-4.096, LTC6652-5 l 450 ppm/mA Minimum Operating Voltage (Note 5) ISOURCE = 5mA, VOUT Error ≤ 0.1% LTC6652-1.25, LTC6652-2.048 l 2.7 V LTC6652-2.5, LTC6652-3, LTC6652-3.3, l VOUT + 0.3V V LTC6652-4.096, LTC6652-5 Output Short-Circuit Current Short VOUT to GND 16 mA Short VOUT to VIN 16 mA Shutdown Pin (SHDN) Logic High Input Voltage l 2 V Logic High Input Current l 0.1 1 µA Logic Low Input Voltage l 0.8 V Logic Low Input Current l 0.1 1 µA Supply Current No Load 350 µA l 560 µA Shutdown Current SHDN Tied to GND l 0.1 2 µA Output Voltage Noise (Note 6) 0.1Hz ≤ f ≤ 10Hz LTC6652-1.25 2.4 ppmP-P LTC6652-2.048, LTC6652-2.5, LTC6652-3 2.1 ppmP-P LTC6652-3.3 2.2 ppmP-P LTC6652-4.096 2.3 ppmP-P LTC6652-5 2.8 ppmP-P 10Hz ≤ f ≤ 1kHz 3 ppmRMS Turn-On Time 0.1% Settling, CLOAD = 0 100 µs Long-Term Drift of Output Voltage (Note 7) LTC6652MS8 60 ppm/√kHr LTC6652LS8 20 ppm/√kHr Hysteresis (Note 8) ∆T = –40°C to 125°C, LTC6652MS8 80 ppm ∆T = –40°C to 85°C, LTC6652MS8 75 ppm ∆T = 0°C to 70°C, LTC6652MS8 45 ppm ∆T = –40°C to 125°C, LTC6652LS8 45 ppm ∆T = –40°C to 85°C, LTC6652LS8 25 ppm ∆T = 0°C to 70°C, LTC6652LS8 10 ppm
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 7:
Long-term stability typically has a logarithmic characteristic and may cause permanent damage to the device. Exposure to any Absolute therefore, changes after 1000 hours tend to be much smaller than before that Maximum Rating condition for extended periods may affect device time. Total drift in the second thousand hours is normally less than one third reliability and lifetime. that of the first thousand hours with a continuing trend toward reduced drift
Note 2
: If the parts are stored outside of the specified temperature range, with time. Long-term stability will also be affected by differential stresses the output may shift due to hysteresis. between the IC and the board material created during board assembly.
Note 3:
Temperature coefficient is measured by dividing the maximum
Note 8:
Hysteresis in output voltage is created by package stress that change in output voltage by the specified temperature range. differs depending on whether the IC was previously at a higher or lower
Note 4:
Load regulation is measured on a pulse basis from no load to the temperature. Output voltage is always measured at 25°C, but the IC is specified load current. Output changes due to die temperature change cycled to the hot or cold temperature limit before successive measurements. must be taken into account separately. Hysteresis is roughly proportional to the square of the temperature change. For instruments that are stored at well controlled temperatures (within 20
Note 5:
Excludes load regulation errors. or 30 degrees of operational temperature) it’s usually not a dominant error
Note 6:
Peak-to-peak noise is measured with a 3-pole highpass at 0.1Hz source.Typical hysteresis is the worst-case of 25°C to cold to 25°C or 25°C and 4-pole lowpass filter at 10Hz. The unit is enclosed in a still-air to hot to 25°C, preconditioned by one thermal cycle. environment to eliminate thermocouple effects on the leads. The test
Note 9:
The stated temperature is typical for soldering of the leads during time is 10 seconds. RMS noise is measured on a spectrum analyzer in manual rework. For detailed IR reflow recommendations, refer to the a shielded environment where the intrinsic noise of the instrument is Applications section. removed to determine the actual noise of the device. 6652fg 4 For more information www.linear.com/LTC6652 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Pin Configuration Order Information Available Options Electrical Characteristics Typical Performance Characteristics Pin Functions Block Diagram Applications Information Typical Applications Package Description Revision History Typical Application Related Parts
e lectrical characteristics The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C, VIN = VOUT + 0.5V, unless otherwise noted. PARAMETER CONDITIONS MIN TYP MAX UNITS
Load Regulation (Note 4) ISOURCE = 5mA, LTC6652-1.25, LTC6652-2.048, 20 75 ppm/mA LTC6652-2.5, LTC6652-3, LTC6652-3.3, l 200 ppm/mA LTC6652-4.096, LTC6652-5 ISINK = 1mA, LTC6652-1.25, LTC6652-2.048 80 250 ppm/mA l 600 ppm/mA ISINK = 5mA, LTC6652-2.5, LTC6652-3, 50 150 ppm/mA LTC6652-3.3, LTC6652-4.096, LTC6652-5 l 450 ppm/mA Minimum Operating Voltage (Note 5) ISOURCE = 5mA, VOUT Error ≤ 0.1% LTC6652-1.25, LTC6652-2.048 l 2.7 V LTC6652-2.5, LTC6652-3, LTC6652-3.3, l VOUT + 0.3V V LTC6652-4.096, LTC6652-5 Output Short-Circuit Current Short VOUT to GND 16 mA Short VOUT to VIN 16 mA Shutdown Pin (SHDN) Logic High Input Voltage l 2 V Logic High Input Current l 0.1 1 µA Logic Low Input Voltage l 0.8 V Logic Low Input Current l 0.1 1 µA Supply Current No Load 350 µA l 560 µA Shutdown Current SHDN Tied to GND l 0.1 2 µA Output Voltage Noise (Note 6) 0.1Hz ≤ f ≤ 10Hz LTC6652-1.25 2.4 ppmP-P LTC6652-2.048, LTC6652-2.5, LTC6652-3 2.1 ppmP-P LTC6652-3.3 2.2 ppmP-P LTC6652-4.096 2.3 ppmP-P LTC6652-5 2.8 ppmP-P 10Hz ≤ f ≤ 1kHz 3 ppmRMS Turn-On Time 0.1% Settling, CLOAD = 0 100 µs Long-Term Drift of Output Voltage (Note 7) LTC6652MS8 60 ppm/√kHr LTC6652LS8 20 ppm/√kHr Hysteresis (Note 8) ∆T = –40°C to 125°C, LTC6652MS8 80 ppm ∆T = –40°C to 85°C, LTC6652MS8 75 ppm ∆T = 0°C to 70°C, LTC6652MS8 45 ppm ∆T = –40°C to 125°C, LTC6652LS8 45 ppm ∆T = –40°C to 85°C, LTC6652LS8 25 ppm ∆T = 0°C to 70°C, LTC6652LS8 10 ppm
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 7:
Long-term stability typically has a logarithmic characteristic and may cause permanent damage to the device. Exposure to any Absolute therefore, changes after 1000 hours tend to be much smaller than before that Maximum Rating condition for extended periods may affect device time. Total drift in the second thousand hours is normally less than one third reliability and lifetime. that of the first thousand hours with a continuing trend toward reduced drift
Note 2
: If the parts are stored outside of the specified temperature range, with time. Long-term stability will also be affected by differential stresses the output may shift due to hysteresis. between the IC and the board material created during board assembly.
Note 3:
Temperature coefficient is measured by dividing the maximum
Note 8:
Hysteresis in output voltage is created by package stress that change in output voltage by the specified temperature range. differs depending on whether the IC was previously at a higher or lower
Note 4:
Load regulation is measured on a pulse basis from no load to the temperature. Output voltage is always measured at 25°C, but the IC is specified load current. Output changes due to die temperature change cycled to the hot or cold temperature limit before successive measurements. must be taken into account separately. Hysteresis is roughly proportional to the square of the temperature change. For instruments that are stored at well controlled temperatures (within 20
Note 5:
Excludes load regulation errors. or 30 degrees of operational temperature) it’s usually not a dominant error
Note 6:
Peak-to-peak noise is measured with a 3-pole highpass at 0.1Hz source.Typical hysteresis is the worst-case of 25°C to cold to 25°C or 25°C and 4-pole lowpass filter at 10Hz. The unit is enclosed in a still-air to hot to 25°C, preconditioned by one thermal cycle. environment to eliminate thermocouple effects on the leads. The test
Note 9:
The stated temperature is typical for soldering of the leads during time is 10 seconds. RMS noise is measured on a spectrum analyzer in manual rework. For detailed IR reflow recommendations, refer to the a shielded environment where the intrinsic noise of the instrument is Applications section. removed to determine the actual noise of the device. 6652fg 4 For more information www.linear.com/LTC6652 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Pin Configuration Order Information Available Options Electrical Characteristics Typical Performance Characteristics Pin Functions Block Diagram Applications Information Typical Applications Package Description Revision History Typical Application Related Parts