Datasheet LT6654 (Analog Devices) - 6

LT6654
elecTrical characTerisTics The
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denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C, CL = 1µF and VIN = VOUT + 0.5V, unless otherwise noted. For LT6654-1.25, VIN = 2.4V, unless otherwise noted. PARAMETER CONDITIONS MIN TYP MAX UNITS
Long-Term Drift of Output Voltage (Note 7) LT6654S6 60 ppm/√kHr LT6654LS8 15 ppm/√kHr Hysteresis (Note 8) S6 ∆T = 0°C to 70°C 15 ppm ∆T = –40°C to 85°C 30 ppm ∆T = –40°C to 125°C 40 ppm ∆T = –55°C to 125°C 50 ppm LS8 ∆T = 0°C to 70°C 3 ppm ∆T = –40°C to 85°C 11 ppm ∆T = –40°C to 125°C 15 ppm ∆T = –55°C to 125°C 20 ppm
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 7:
Long-term stability typically has a logarithmic characteristic may cause permanent damage to the device. Exposure to any Absolute and therefore, changes after 1000 hours tend to be much smaller than Maximum Rating condition for extended periods may affect device before that time. Total drift in the second thousand hours is normally less reliability and lifetime. than one third that of the first thousand hours with a continuing trend
Note 2:
If the parts are stored outside of the specified temperature range, toward reduced drift with time. Long-term stability will also be affected by the output may shift due to hysteresis. differential stresses between the IC and the board material created during
Note 3:
Temperature coefficient is measured by dividing the maximum board assembly. change in output voltage by the specified temperature range.
Note 8:
Hysteresis in output voltage is created by package stress that
Note 4:
Load regulation is measured on a pulse basis from no load to the differs depending on whether the IC was previously at a higher or specified load current. Output changes due to die temperature change lower temperature. Output voltage is always measured at 25°C, but must be taken into account separately. the IC is cycled to the hot or cold temperature limit before successive measurements. Hysteresis measures the maximum output change for the
Note 5
: Excludes load regulation errors. averages of three hot or cold temperature cycles. For instruments that
Note 6
: Peak-to-peak noise is measured with a 1-pole highpass filter at are stored at well controlled temperatures (within 20 or 30 degrees of 0.1Hz and 2-pole lowpass filter at 10Hz. The unit is enclosed in a still-air operational temperature), it is usually not a dominant error source. Typical environment to eliminate thermocouple effects on the leads. The test hysteresis is the worst-case of 25°C to cold to 25°C or 25°C to hot to time is 10 seconds. RMS noise is measured on a spectrum analyzer in 25°C, preconditioned by one thermal cycle. a shielded environment where the intrinsic noise of the instrument is
Note 9:
The stated temperature is typical for soldering of the leads during removed to determine the actual noise of the device. manual rework. For detailed IR reflow recommendations, refer to the Applications Information section. 6654fh 6 For more information www.linear.com/LT6654 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Pin Configuration Order Information Available Options Electrical Characteristics Typical Performance Characteristics Pin Functions Block Diagrams Applications Information Typical Applications Package Description Revision History Typical Application Related Parts