Datasheet RH1016M (Analog Devices) - 4
| Hersteller | Analog Devices |
| Beschreibung | UltraFast Precision 10ns Comparator |
| Seiten / Seite | 6 / 4 — TABLE 2: ELECTRICAL TEST REQUIREMENTS. PDA Test Notes. MIL-STD-883 TEST … |
| Dateiformat / Größe | PDF / 119 Kb |
| Dokumentensprache | Englisch |
TABLE 2: ELECTRICAL TEST REQUIREMENTS. PDA Test Notes. MIL-STD-883 TEST REQUIREMENTS. SUBGROUP. TOTAL DOSE BIAS CIRCUIT
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RH1016M
TABLE 2: ELECTRICAL TEST REQUIREMENTS PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specifi ed as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5 tests after cooldown as the fi nal electrical test in accordance with method Group A Test Requirements (Method 5005) 1*,2,3,4,5 5004 of MIL-STD-883. The verifi ed failures of group A, subgroup 1, after Group B and D for Class S, 1,2,3 burn-in divided by the total number of devices submitted for burn-in in that End Point Electrical Parameters (Method 5005) lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
V+ 5V RH1016 W10 TO FP14 R1 C1 1 14 5.11k 0.01μF 2 13 V+ Q 3 12 +IN Q R2 4 11 –IN GND 1k 5 10 V– EN C2 6 9 R3 NC NC 5.11k 0.01μF 7 8 RH1016 BIAS V– –5V rh1016fa 4
TABLE 2: ELECTRICAL TEST REQUIREMENTS PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specifi ed as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5 tests after cooldown as the fi nal electrical test in accordance with method Group A Test Requirements (Method 5005) 1*,2,3,4,5 5004 of MIL-STD-883. The verifi ed failures of group A, subgroup 1, after Group B and D for Class S, 1,2,3 burn-in divided by the total number of devices submitted for burn-in in that End Point Electrical Parameters (Method 5005) lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
V+ 5V RH1016 W10 TO FP14 R1 C1 1 14 5.11k 0.01μF 2 13 V+ Q 3 12 +IN Q R2 4 11 –IN GND 1k 5 10 V– EN C2 6 9 R3 NC NC 5.11k 0.01μF 7 8 RH1016 BIAS V– –5V rh1016fa 4