Datasheet OP97 (Analog Devices) - 4

TABLE I. Electrical performance characteristics. Conditions Test Symbol -55°C ≤ TA ≤ +125°C Group A Device Limits Unit V subgroups type S = ±15 V, RS = 50 Ω unless otherwise specified Min Max Input offset voltage VIO 1 01 ±25 µV 2,3 ±60 Input offset voltage TCV temperature coefficient OS 2,3 01 0.6 µV/°C Input offset current IIO 1 01 ±100 pA 2,3 ±250 Input bias current IIB 1 01 ±100 pA 2,3 ±250 CMRR V Common mode rejection CM = IVR = ±13.5 V 1/ 1 01 114 dB ratio 2,3 108 PSRR V Power supply rejection S = ±2 V to ±20 V 1 01 114 dB ratio VS = ±2.5 V to ±20 V 2,3 108 Supply current IS No load 1 01 600 µA 2,3 800 Large signal voltage gain AVO VO = ±10 V, RL = 2 kΩ 4 01 300 V / mV 5,6 200 Output voltage swing VO RL = 10 kΩ 4,5,6 01 ±13 V Slew rate SR 7 01 0.1 V / µs 8 0.05 0.1 Hz to 10 Hz, Input noise voltage Ent 9 01 280 nVrms TA = +25°C Closed loop bandwidth BW AVCL = +1, TA = +25°C 4 01 0.4 MHz 1/ IVR is defined as the VCM range used for the CMRR test.
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A 5962-89544 MICROCIRCUIT DRAWING
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 C
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DSCC FORM 2234 APR 97