Datasheet AD842 (Analog Devices) - 7

TABLE I. Electrical performance characteristics – Continued. Conditions 1/ Test Symbol -55°C ≤ TA ≤ +125°C Group A Device Limits 2/ Unit ±V subgroups type S = ±15 V unless otherwise specified Min Max Overshoot 4/ +OS V 9 01 50 % OUT = 0 V to +200 mV, AV = +2, RL = 500 Ω, TA = +25°C -OS V 50 OUT = 0 V to -200 mV, AV = +2, RL = 500 Ω, TA = +25°C Slew rate 4/ +SR V 9 01 300 V/µs OUT = -5.0 V to 5.0 V, measured from 10 % to 90 % point, R 10,11 200 L = 500 Ω, AV = -2 V/V, rising edge -SR V 9 300 OUT = 5.0 V to -5.0 V, measured from 90 % to 10 % point, R 10,11 200 L = 500 Ω, AV = -2 V/V, falling edge Rise time 4/ 6/ t 9,10,11 01 10 ns R VOUT = 0 V to +200 mV, AV = +2, RL = 500 Ω Fall time 4/ 6/ t 9,10,11 01 10 ns F VOUT = 0 V to -200 mV, AV = +2, RL = 500 Ω 1/ Unless otherwise specified, for dc tests, RL = 100 Ω and VOUT = 0 V. 2/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used in this table. Negative current shall be defined as conventional current flow out of device terminal. 3/ Quiescent power consumption is based on quiescent supply current test maximum with no load on outputs. 4/ If not tested, shall be guaranteed to the limits specified in table I herein. 5/ Full power bandwidth = SR / ( 2π x VPK ). 6/ Rise and fall times measured between 10 percent and 90 percent point.
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A 5962-89642 MICROCIRCUIT DRAWING
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 E
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DSCC FORM 2234 APR 97