Datasheet AD841 (Analog Devices) - 6

TABLE I. Electrical performance characteristics – Continued. Conditions 1/ Test Symbol -55°C ≤ TA ≤ +125°C Group A Device Limits 2/ Unit ±V subgroups type S = ±15 V unless otherwise specified Min Max Rise time 4/ 6/ t 9,10,11 01 10 ns R VOUT = 0 V to +200 mV, AV = +1, RL = 500 Ω, Fall time 4/ 6/ t 9,10,11 01 10 ns F VOUT = 0 V to -200 mV, AV = +1, RL = 500 Ω, Settling time 4/ t 9 01 150 ns S AV = -1 V/V, RL = 500 Ω, 10 V step at 0.1 % of the fixed value, TA = +25°C A 200 V = -1 V/V, RL = 500 Ω, 10 V step at 0.01 % of the fixed value, TA = +25°C Overshoot 4/ +OS V 9 01 40 % OUT = 0 V to +200 mV, AV = +1, RL = 500 Ω, TA = +25°C -OS V 40 OUT = 0 V to -200 mV, AV = +1, RL = 500 Ω, TA = +25°C 1/ Unless otherwise specified, for dc tests, RL = 100 kΩ and VOUT = 0 V. 2/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used in this table. Negative current shall be defined as conventional current flow out of device terminal. 3/ Quiescent power consumption is based on quiescent supply current test maximum with no load on outputs. 4/ If not tested, shall be guaranteed to the limits specified in table I herein. 5/ Full power bandwidth = SR / ( 2π x VPK ). 6/ Rise and fall times measured between 10 percent and 90 percent point.
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A 5962-89641 MICROCIRCUIT DRAWING
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DSCC FORM 2234 APR 97