Datasheet AD811 (Analog Devices) - 6

TABLE I. Electrical performance characteristics - Continued. Conditions Test Symbol -55°C ≤ TA ≤ +125°C Group A Device Limits 1/ Unit unless otherwise specified subgroups type Min Max Common mode CMRR VS = ±5 V, VCM = ±2.5 V 1,2,3 01 50 dB rejection ratio VS = ±15 V, VCM = ±10 V 56 Small signal 3/ SSBW VS = ±15 V, RL = 150 Ω, 4 01 100 MHz bandwidth, G = +2 RF = 649 Ω, RG = 649 Ω Slew rate 3/ SR V 4 01 1800 V/µs S = ±15 V, VOUT = 20 VPP, G = -10 RF = 590 Ω, RG = 55 Ω, measured at -10 V to +10 V Settling time 3/ t 9 01 200 ns S VS = ±15 V, VOUT = ±5 V, G = -1 RF = 562 Ω, RG = 562 Ω, 10 V step at 0.01% of the final value 1/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used in this table. Negative current shall be defined as conventional current flow out of a device terminal. 2/ Transresistance is defined as the amplifier's output voltage divided by the required feedback current in its inverting input. As an example, an amplifier which requires a 1 µA input current to change its output voltage by 1 V has a transresistance of 1 MΩ. 3/ If not tested, shall be guaranteed to the limits specified in table I herein.
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5962-93131 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 C 6 DSCC FORM 2234 APR 97 Document Outline DEPARTMENT OF DEFENSE SPECIFICATION DEPARTMENT OF DEFENSE STANDARDS