Datasheet AD8672 (Analog Devices) - 9

TABLE I. Electrical performance characteristics – Continued. 1/ Test Symbol Conditions Temperature, Device Limits Unit V type S = 15.0 V, VCM = 0 V TA unless otherwise specified Min Max Dynamic performance Slew rate SR RL = 2 k +25C 01 4 typical V/s Settling time tS To 0.1%, 10 V step, G = 1 +25C 01 2.2 typical s To 0.01%, 10 V step, G = 1 6.3 typical Gain bandwidth GBP +25C 01 10 typical MHz product Noise performance Peak to peak noise en p-p 0.1 Hz to 10 Hz +25C 01 100 nV p-p 77 typical Voltage noise density en f = 1 kHz +25C 01 3.8 nV / Hz 2.8 typical Current noise density in f = 1 kHz +25C 01 0.3 typical pA / Hz Channel separation CS f = 1 kHz +25C 01 -130 typical dB f = 10 kHz -105 typical 1/ Testing and other quality control techniques are used to the extent deemed necessary to assure product performance over the specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters may not necessarily be tested. In the absence of specific parametric testing, product performance is assured by characterization and/or design.
DLA LAND AND MARITIME
SIZE CODE IDENT NO. DWG NO.
COLUMBUS, OHIO A 16236 V62/16603
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