Datasheet ADIS16135 (Analog Devices) - 6
| Hersteller | Analog Devices |
| Beschreibung | ±300°/Sec Precision Angular Rate Sensor |
| Seiten / Seite | 21 / 6 — Data Sheet. ADIS16135. ABSOLUTE MAXIMUM RATINGS Table 3. Parameter. … |
| Revision | F |
| Dateiformat / Größe | PDF / 590 Kb |
| Dokumentensprache | Englisch |
Data Sheet. ADIS16135. ABSOLUTE MAXIMUM RATINGS Table 3. Parameter. Rating. Table 4. Package Characteristics. Package Type. θJC
Modelllinie für dieses Datenblatt
Textversion des Dokuments
Data Sheet ADIS16135 ABSOLUTE MAXIMUM RATINGS Table 3.
Stresses above those listed under Absolute Maximum Ratings
Parameter Rating
may cause permanent damage to the device. This is a stress Acceleration rating only; functional operation of the device at these or any Any Axis, Unpowered 2000 g other conditions above those indicated in the operational Any Axis, Powered 2000 g section of this specification is not implied. Exposure to absolute VCC to GND −0.3 V to +7.0 V maximum rating conditions for extended periods may affect Digital Input Voltage to GND −0.3 V to +5.3 V device reliability. Digital Output Voltage to GND −0.3 V to VCC + 0.3 V
Table 4. Package Characteristics
Operating Temperature Range −40°C to +105°C
Package Type θ
Storage Temperature Range −65°C to +125°C1, 2
JA θJC Device Weight
24-Lead Module (ML-24-3) 15.7 1.48 31 g 1 Extended exposure to temperatures outside the specified temperature range of −40°C to +105°C can adversely affect the accuracy of the factory calibration. For best accuracy, store the parts within the specified operating range of −40°C to +105°C.
ESD CAUTION
2 Although the device is capable of withstanding short-term exposure to 150°C, long-term exposure threatens internal mechanical integrity. Rev. F | Page 5 of 20 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Basic Operation Reading Sensor Data Output Data Registers Rotation Rate (Gyroscope) Internal Temperature Dual Memory Structure User Registers Digital Processing Configuration Internal Sample Rate Input Clock Configuration Digital Filtering Averaging/Decimation Filter Calibration Automatic Bias Correction Manual Bias Correction Alarms Static Alarm Use Dynamic Alarm Use Alarm Reporting Alarm Example System Controls Global Commands Software Reset Memory Management Checksum Test General-Purpose I/O Data Ready I/O Indicator Example I/O Configuration Self-Test Power Management Status Product Identification Applications Information Breakout Board Installation Tips Outline Dimensions Ordering Guide
Stresses above those listed under Absolute Maximum Ratings
Parameter Rating
may cause permanent damage to the device. This is a stress Acceleration rating only; functional operation of the device at these or any Any Axis, Unpowered 2000 g other conditions above those indicated in the operational Any Axis, Powered 2000 g section of this specification is not implied. Exposure to absolute VCC to GND −0.3 V to +7.0 V maximum rating conditions for extended periods may affect Digital Input Voltage to GND −0.3 V to +5.3 V device reliability. Digital Output Voltage to GND −0.3 V to VCC + 0.3 V
Table 4. Package Characteristics
Operating Temperature Range −40°C to +105°C
Package Type θ
Storage Temperature Range −65°C to +125°C1, 2
JA θJC Device Weight
24-Lead Module (ML-24-3) 15.7 1.48 31 g 1 Extended exposure to temperatures outside the specified temperature range of −40°C to +105°C can adversely affect the accuracy of the factory calibration. For best accuracy, store the parts within the specified operating range of −40°C to +105°C.
ESD CAUTION
2 Although the device is capable of withstanding short-term exposure to 150°C, long-term exposure threatens internal mechanical integrity. Rev. F | Page 5 of 20 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Basic Operation Reading Sensor Data Output Data Registers Rotation Rate (Gyroscope) Internal Temperature Dual Memory Structure User Registers Digital Processing Configuration Internal Sample Rate Input Clock Configuration Digital Filtering Averaging/Decimation Filter Calibration Automatic Bias Correction Manual Bias Correction Alarms Static Alarm Use Dynamic Alarm Use Alarm Reporting Alarm Example System Controls Global Commands Software Reset Memory Management Checksum Test General-Purpose I/O Data Ready I/O Indicator Example I/O Configuration Self-Test Power Management Status Product Identification Applications Information Breakout Board Installation Tips Outline Dimensions Ordering Guide