Datasheet ADXRS453 (Analog Devices) - 4

HerstellerAnalog Devices
BeschreibungHigh Performance, Digital Output Gyroscope
Seiten / Seite33 / 4 — Data Sheet. ADXRS453. SPECIFICATIONS. Table 1. Parameter Test. …
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DokumentenspracheEnglisch

Data Sheet. ADXRS453. SPECIFICATIONS. Table 1. Parameter Test. Conditions/Comments. Symbol. Min. Typ. Max. Unit

Data Sheet ADXRS453 SPECIFICATIONS Table 1 Parameter Test Conditions/Comments Symbol Min Typ Max Unit

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Data Sheet ADXRS453 SPECIFICATIONS
TA = TMIN to TMAX, PDD = 5 V, angular rate = 0°/sec, bandwidth = f0/200 (~77.5 Hz), ±1 g, continuous self-test on.
Table 1. Parameter Test Conditions/Comments Symbol Min Typ Max Unit
MEASUREMENT RANGE Full-scale range FSR ±300 ±400 °/sec SENSITIVITY See Figure 2 Nominal Sensitivity 80 LSB/°/sec Sensitivity Tolerance TA = −40°C to +105°C −3 +3 % Nonlinearity1 Best fit straight line 0.05 % FSR rms Cross-Axis Sensitivity2 −3 +3 % NULL ACCURACY TA = 25°C ±0.4 °/sec TA = −40°C to +105°C ±0.5 °/sec NOISE PERFORMANCE Rate Noise Density TA = 25°C 0.015 °/sec/√Hz TA = 105°C 0.023 °/sec/√Hz LOW-PASS FILTER Cutoff (−3 dB) Frequency f0/200 fLP 77.5 Hz Group Delay3 f = 0 Hz tLP 3.25 4 4.75 ms SENSOR RESONANT FREQUENCY f0 13 15.5 19 kHz SHOCK AND VIBRATION IMMUNITY Sensitivity to Linear Acceleration DC to 5 kHz 0.01 °/sec/g Vibration Rectification 0.0002 °/sec/g2 SELF-TEST See the Continuous Self-Test section Magnitude 2559 LSB Fault Register Threshold Compared to LOCSTx register data 2239 2879 LSB Sensor Data Status Threshold Compared to LOCSTx register data 1279 3839 LSB Frequency f0/32 fST 485 Hz ST Low-Pass Filter Cutoff (−3 dB) Frequency f0/8000 1.95 Hz Group Delay3 52 64 76 ms SPI COMMUNICATIONS Clock Frequency 8.08 MHz Voltage Input High MOSI, CS, SCLK 0.85 × PDD PDD + 0.3 V Voltage Input Low MOSI, CS, SCLK −0.3 PDD × 0.15 V Voltage Output Low MISO, current = 3 mA 0.5 V Voltage Output High MISO, current = −2 mA PDD − 0.5 V Pull-Up Current CS, PDD = 3.3 V, CS = PDD × 0.15 60 200 μA CS, PDD = 5 V, CS = PDD × 0.15 80 300 μA MEMORY REGISTERS See the Memory Register Definitions section Temperature Register Value at 45°C 0 LSB Scale Factor 5 LSB/°C Quadrature, Self-Test, and Rate Registers Scale Factor 80 LSB/°/sec POWER SUPPLY Supply Voltage PDD 3.15 5.25 V Quiescent Supply Current IDD 6.0 8.0 mA Turn-On Time Power-on to 0.5°/sec of final value 100 ms 1 Maximum limit is guaranteed by Analog Devices, Inc., characterization. 2 Cross-axis sensitivity specification does not include effects due to device mounting on a printed circuit board (PCB). 3 Minimum and maximum limits are guaranteed by design. Rev. B | Page 3 of 32 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Absolute Maximum Ratings Thermal Resistance Rate Sensitive Axis ESD Caution Pin Configurations and Function Descriptions Typical Performance Characteristics Theory of Operation Continuous Self-Test Mechanical Performance Noise Performance Applications Information Calibrated Performance Mechanical Considerations for Mounting Application Circuits ADXRS453 Signal Chain Timing SPI Communication Protocol Command/Response Device Data Latching SPI Timing Characteristics Command/Response Bit Definitions SQ2 to SQ0 Bits SM2 to SM0 Bits A8 to A0 Bits D15 to D0 Bits P Bit SPI Bit RE Bit DU Bit ST1 and ST0 Bits P0 Bit P1 Bit Fault Register Bit Definitions Fail Bit AMP Bit OV Bit UV Bit PLL Bit Q Bit NVM Bit POR Bit PWR Bit CST Bit CHK Bit Recommended Start-Up Sequence with CHK Bit Assertion Rate Data Format Memory Map and Registers Memory Map Memory Register Definitions Rate (RATEx) Registers Temperature (TEMx) Registers Low CST (LOCSTx) Registers High CST (HICSTx) Registers Quad Memory (QUADx) Registers Fault (FAULTx) Registers Part ID (PIDx) Registers Serial Number (SNx) Registers Package Orientation and Layout Information Solder Profile Package Marking Codes Outline Dimensions Ordering Guide