Datasheet AD526 (Analog Devices) - 10

TABLE IIA. Electrical test requirements. Test requirements Subgroups Subgroups (in accordance with (in accordance with MIL-STD-883, MIL-PRF-38535, table III) method 5005, table I) Device Device Device class M class Q class V Interim electrical 1 1 1 parameters (see 4.2) Final electrical 1,2,3,4 1/ 1,2,3,4 1/ 1,2,3,4 1/ 2/ parameters (see 4.2) Group A test 1,2,3,4,5,6 1,2,3,4,5,6 1,2,3,4,5,6 requirements (see 4.4) Group C end-point electrical 1 1 1 2/ parameters (see 4.4) Group D end-point electrical 1 1 1 parameters (see 4.4) Group E end-point electrical --- 1,4 1,4 parameters (see 4.4) 1/ PDA applies to subgroup 1. 2/ Delta limits in accordance with table IIB shall be computed with reference to the previous interim electrical parameters. TABLE IIB. Delta limits at +25°C. Parameter 1/ Device type All GE ±10 % of specified value in table I. VIO ±10 % of specified value in table I. IIB ±10 % of specified value in table I. 1/ The above parameters shall be recorded before and after the required burn-in and life test to determine the delta. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. b. TA = +125°C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
STANDARD
SIZE
5962-90894 MICROCIRCUIT DRAWING A
DEFENSE SUPPLY CENTER COLUMBUS REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 B 10 DSCC FORM 2234 APR 97