LTC2450 POWER REQUIREMENTSThe l denotes the specifi cations which apply over the full operating temperaturerange,otherwise specifi cations are at TA = 25°C.SYMBOLPARAMETERCONDITIONSMINTYPMAXUNITS VCC Supply Voltage l 2.7 5.5 V ICC Supply Current Conversion CS = GND (Note 6) l 350 600 μA Sleep CS = VCC (Note 6) l 0.05 0.5 μA TheDIGITAL INPUTS AND DIGITAL OUTPUTS l denotes the specifi cations which apply over the fulloperating temperature range,otherwise specifi cations are at TA = 25°C. (Note 2)SYMBOLPARAMETERCONDITIONSMINTYPMAXUNITS VIH High Level Input Voltage l VCC – 0.3 V VIL Low Level Input Voltage l 0.3 V IIN Digital Input Current l –10 10 μA CIN Digital Input Capacitance 10 pF VOH High Level Output Voltage IO = –800μA l VCC – 0.5 V VOL Low Level Output Voltage IO = –1.6mA l 0.4 V IOZ Hi-Z Output Leakage Current l –10 10 μA TheTIMING CHARACTERISTICS l denotes the specifi cations which apply over the full operating temperaturerange,otherwise specifi cations are at TA = 25°C.SYMBOLPARAMETERCONDITIONSMINTYPMAXUNITS tCONV Conversion Time l 29 33.3 42 ms fSCK SCK Frequency Range l 2 MHz tlSCK SCK Low Period l 250 ns thSCK SCK High Period l 250 ns t1 CS Falling Edge to SDO Low Z (Notes 7, 8) l 0 100 ns t2 CS Rising Edge to SDO High Z (Notes 7, 8) l 0 100 ns t3 CS Falling Edge to SCK Falling Edge l 100 ns tKQ SCK Falling Edge to SDO Valid (Note 7) l 0 100 ns Note 1: Stresses beyond those listed under Absolute Maximum Ratings Note 5: CS = VCC. A positive current is fl owing into the DUT pin. may cause permanent damage to the device. Exposure to any Absolute Note 6: SCK = VCC or GND. SDO is high impedance. Maximum Rating condition for extended periods may affect device Note 7: See Figure 3. reliability and lifetime. Note 8: See Figure 4. Note 2: All voltage values are with respect to GND. VCC = 2.7V to 5.5V Note 9: Input sampling current is the average input current drawn from the unless otherwise specifi ed. input sampling network while the LTC2450 is actively sampling the input. Note 3: Guaranteed by design, not subject to test. Note 4: Integral nonlinearity is defi ned as the deviation of a code from a straight line passing through the actual endpoints of the transfer curve. The deviation is measured from the center of the quantization band. Guaranteed by design, test correlation and 3 point transfer curve measurement. 2450fb 3