Datasheet LTC1411 (Analog Devices) - 4
| Hersteller | Analog Devices |
| Beschreibung | Single Supply 14-Bit 2.5Msps ADC |
| Seiten / Seite | 16 / 4 — W U. TI I G CHARACTERISTICS The. denotes specifications which apply over … |
| Dateiformat / Größe | PDF / 233 Kb |
| Dokumentensprache | Englisch |
W U. TI I G CHARACTERISTICS The. denotes specifications which apply over the full operating temperature
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LTC1411
W U TI I G CHARACTERISTICS The
●
denotes specifications which apply over the full operating temperature range, otherwise specifications are TA = 25
°
C. (Notes 5) (See Figures 11a, 11b) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
fSAMPLE(MAX) Maximum Sampling Frequency (Note 9) ● 2.5 MHz tCONV Conversion Time ● 250 350 ns tACQ Acquisition Time 100 ns t0 SLP↑ to CONVST↓ Wake-Up Time 10µF Bypass Capacitor at REFCOM2 Pin 210 ms t1 NAP↑ to CONVST↓ Wake-Up Time 250 ns t2 CONVST Low Time (Note 10) ● 20 ns t3 CONVST to BUSY Delay CL = 25pF 12 ns t4 Data Ready After BUSY↑ 7 ns t5 CONVST High Time (Note 10) ● 20 ns t6 Aperture Delay of Sample-and-Hold 7 ns
Note 1:
Absolute Maximum Ratings are those values beyond which the life
Note 7:
Integral nonlinearity is defined as the deviation of a code from a of a device may be impaired. straight line passing through the actual endpoints of the transfer curve.
Note 2:
All voltage values are with respect to ground with DGND, OGND, The deviation is measured from the center of the quantization band. AVM and AGND wired together unless otherwise noted.
Note 8:
Bipolar offset is the offset voltage measured from – 0.5LSB
Note 3:
When these pin voltages are taken below AGND or above V when the output code flickers between 0000 0000 0000 00 and DD, they will be clamped by internal diodes. This product can handle input 1111 1111 1111 11. currents greater than 100mA without latchup.
Note 9:
Recommended operating conditions.
Note 4:
When these pin voltages are taken below AGND, they will be
Note 10:
The falling CONVST edge starts a conversion. If CONVST returns clamped by internal diodes. This product can handle input currents greater high at a critical point during the conversion it can create small errors. For than 100mA below AGND without latchup. These pins are not clamped to best performance ensure that CONVST returns high within 20ns after VDD. conversion start of after BUSY rises.
Note 5:
VDD = 5V, PGA1 = PGA0 = 5V, fSAMPLE = 2.5MHz at 25°C and
Note 11:
SLP and NAP have an internal pull-down so the pins will draw tr = tf = 5ns unless otherwise specified. approximately 7µA when tied high and less than 1µA when tied low.
Note 6:
Linearity, offset and full-scale specifications apply for a single- ended A + – IN input with AIN tied to an external 2.5V reference voltage.
W U TYPICAL PERFOR A CE CHARACTERISTICS Signal-to-Noise Ratio S/(N + D) vs Input Frequency vs Input Frequency Distortion vs Input Frequency
86 86 0 80 80 –10 74 74 –20 68 68 –30 62 62 –40 56 56 –50 50 50 –60 44 SNR (dB) 44 S/(N + D) (dB) –70 38 38 DISTORTION (dB) –80 32 32 THD 2ND 26 26 –90 3RD 20 20 –100 14 14 –110 10 100 1000 10000 10 100 1000 10000 10 100 1000 10000 INPUT FREQUENCY (kHz) INPUT FREQUENCY (kHz) INPUT FREQUENCY (kHz) 1411 G01 1411 G02 1411 G03 1411f 4
W U TI I G CHARACTERISTICS The
●
denotes specifications which apply over the full operating temperature range, otherwise specifications are TA = 25
°
C. (Notes 5) (See Figures 11a, 11b) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
fSAMPLE(MAX) Maximum Sampling Frequency (Note 9) ● 2.5 MHz tCONV Conversion Time ● 250 350 ns tACQ Acquisition Time 100 ns t0 SLP↑ to CONVST↓ Wake-Up Time 10µF Bypass Capacitor at REFCOM2 Pin 210 ms t1 NAP↑ to CONVST↓ Wake-Up Time 250 ns t2 CONVST Low Time (Note 10) ● 20 ns t3 CONVST to BUSY Delay CL = 25pF 12 ns t4 Data Ready After BUSY↑ 7 ns t5 CONVST High Time (Note 10) ● 20 ns t6 Aperture Delay of Sample-and-Hold 7 ns
Note 1:
Absolute Maximum Ratings are those values beyond which the life
Note 7:
Integral nonlinearity is defined as the deviation of a code from a of a device may be impaired. straight line passing through the actual endpoints of the transfer curve.
Note 2:
All voltage values are with respect to ground with DGND, OGND, The deviation is measured from the center of the quantization band. AVM and AGND wired together unless otherwise noted.
Note 8:
Bipolar offset is the offset voltage measured from – 0.5LSB
Note 3:
When these pin voltages are taken below AGND or above V when the output code flickers between 0000 0000 0000 00 and DD, they will be clamped by internal diodes. This product can handle input 1111 1111 1111 11. currents greater than 100mA without latchup.
Note 9:
Recommended operating conditions.
Note 4:
When these pin voltages are taken below AGND, they will be
Note 10:
The falling CONVST edge starts a conversion. If CONVST returns clamped by internal diodes. This product can handle input currents greater high at a critical point during the conversion it can create small errors. For than 100mA below AGND without latchup. These pins are not clamped to best performance ensure that CONVST returns high within 20ns after VDD. conversion start of after BUSY rises.
Note 5:
VDD = 5V, PGA1 = PGA0 = 5V, fSAMPLE = 2.5MHz at 25°C and
Note 11:
SLP and NAP have an internal pull-down so the pins will draw tr = tf = 5ns unless otherwise specified. approximately 7µA when tied high and less than 1µA when tied low.
Note 6:
Linearity, offset and full-scale specifications apply for a single- ended A + – IN input with AIN tied to an external 2.5V reference voltage.
W U TYPICAL PERFOR A CE CHARACTERISTICS Signal-to-Noise Ratio S/(N + D) vs Input Frequency vs Input Frequency Distortion vs Input Frequency
86 86 0 80 80 –10 74 74 –20 68 68 –30 62 62 –40 56 56 –50 50 50 –60 44 SNR (dB) 44 S/(N + D) (dB) –70 38 38 DISTORTION (dB) –80 32 32 THD 2ND 26 26 –90 3RD 20 20 –100 14 14 –110 10 100 1000 10000 10 100 1000 10000 10 100 1000 10000 INPUT FREQUENCY (kHz) INPUT FREQUENCY (kHz) INPUT FREQUENCY (kHz) 1411 G01 1411 G02 1411 G03 1411f 4