Datasheet MC34071,2,4,A; MC33071,2,4,A; NCV33072,4,A (ON Semiconductor) - 3

link to page 3 link to page 3 link to page 3 link to page 3 link to page 5
MC34071,2,4,A MC33071,2,4,A, NCV33072,4,A MAXIMUM RATINGS Rating Symbol Value Unit
Supply Voltage (from VEE to VCC) VS +44 V Input Differential Voltage Range VIDR (Note 1) V Input Voltage Range VIR (Note 1) V Output Short Circuit Duration (Note 2) tSC Indefinite Sec Operating Junction Temperature TJ +150 °C Storage Temperature Range Tstg −60 to +150 °C ESD Capability, Dual and Quad (Note 3) V Human Body Model ESDHBM 2000 Machine Model ESDMM 200 Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Either or both input voltages should not exceed the magnitude of VCC or VEE. 2. Power dissipation must be considered to ensure maximum junction temperature (TJ) is not exceeded (see Figure 2). 3. This device series incorporates ESD protection and is tested by the following methods: ESD Human Body Model tested per AEC−Q100−002 (JEDEC standard: JESD22−A114) ESD Machine Model tested per AEC−Q100−003 (JEDEC standard: JESD22−A115)
http://onsemi.com 3