Datasheet IRF9530NPbF (Infineon) - 7

HerstellerInfineon
BeschreibungHEXFET Power MOSFET
Seiten / Seite9 / 7 — Peak Diode Recovery dv/dt Test Circuit. D.U.T. Fig 14
Dateiformat / GrößePDF / 231 Kb
DokumentenspracheEnglisch

Peak Diode Recovery dv/dt Test Circuit. D.U.T. Fig 14

Peak Diode Recovery dv/dt Test Circuit D.U.T Fig 14

Modelllinie für dieses Datenblatt

Textversion des Dokuments

IRF9530NPbF
Peak Diode Recovery dv/dt Test Circuit
+
D.U.T
* Circuit Layout Considerations • Low Stray Inductance ƒ • Ground Plane • Low Leakage Inductance Current Transformer - + ‚ „ - + -  RG • dv/dt controlled by R + G • ISD controlled by Duty Factor "D" - VDD • D.U.T. - Device Under Test VGS * Reverse Polarity of D.U.T for P-Channel Driver Gate Drive P.W. Period D = P.W. Period V [ GS=10V ] *** D.U.T. ISD Waveform Reverse Recovery Body Diode Forward Current Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt V [ DD ] Re-Applied Voltage Body Diode Forward Drop Inductor Curent Ripple ≤ 5% I [ SD ] *** VGS = 5.0V for Logic Level and 3V Drive Devices
Fig 14.
For P-Channel HEXFETS