Datasheet ADIS16490 (Analog Devices) - 4

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ADIS16490 (Rev. A) Datasheet Parameter Test Conditions/Comments Min Typ Max Unit
Input Current Logic 1, IIH VIH = 3.3 V 10 µA Logic 0, IIL VIL = 0 V All Pins Except RST 10 µA RST Pin 0.33 mA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS4 Output Voltage High, VOH ISOURCE = 0.5 mA 2.4 V Low, VOL ISINK = 2.0 mA 0.4 V FLASH MEMORY Endurance5 100,000 Cycles Data Retention6 TJ = 85°C 20 Years FUNCTIONAL TIMES7 Time until data is available Power-On Start-Up Time 170 ms Reset Recovery Time8 170 ms Flash Memory Update Time 1237 ms Self Test Time9 GLOB_CMD[1] = 1 (see Table 129) 40 ms CONVERSION RATE 4.25 kSPS Initial Clock Accuracy 0.02 % Temperature Coefficient 40 ppm/°C Sync Input Clock 3.0 4.5 kHz POWER SUPPLY, VDD Operating voltage range 3.0 3.6 V Power Supply Current10 Normal mode, VDD = 3.3 V, µ + σ 89 mA 1 The repeatability specifications represent a projection for long-term aging, which is derived from the drift behaviors that a sample of units exhibited throughout their 1000-hour, 110°C high temperature operating life (HTOL). 2 Bias repeatability describes a long-term behavior over a variety of conditions. Short-term repeatability relates to the in run bias stability and noise density specifications. 3 All specifications associated with the accelerometers relate to the ful -scale range of ±5 g. 4 The digital I/O signals use a 3.3 V system. 5 Endurance is qualified as per JEDEC Standard 22, Method A117, measured at −40°C, +25°C, +85°C, and +125°C. 6 The data retention specification assumes a junction temperature (TJ) of 85°C per JEDEC Standard 22, Method A117. Data retention lifetime decreases with TJ. 7 These times do not include thermal settling and internal filter response times, which may affect overal accuracy. 8 The RST line must be in a low state for at least 10 μs to ensure a proper reset initiation and recovery. 9 Self test time can extend when using external clock rates that are lower than 4000 Hz. 10 Supply current transients can reach 250 mA during initial startup or reset recovery. Rev. A | Page 4 of 37 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS Register Specific Stall Times Timing Diagrams ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION INERTIAL SENSOR SIGNAL CHAIN Gyroscope Data Sampling Accelerometer Data Sampling External Clock Options Inertial Sensor Calibration Gyroscope Factory Calibration Accelerometer Factory Calibration Filtering REGISTER STRUCTURE SERIAL PERIPHERAL INTERFACE DATA READY READING SENSOR DATA DEVICE CONFIGURATION Dual Memory Structure USER REGISTER MEMORY MAP USER REGISTER DEFINTIONS Page Number (PAGE_ID) Data/Sample Counter (DATA_CNT) Status/Error Flag Indicators (SYS_E_FLAG) Self Test Error Flags (DIAG_STS) Internal Temperature (TEMP_OUT) GYROSCOPE DATA X-Axis Gyroscope (X_GYRO_LOW, X_GRYO_OUT) Y-Axis Gyroscope (Y_GYRO_LOW, Y_GYRO_OUT) Z-Axis Gyroscope (Z_GYRO_LOW, Z_GYRO_OUT) Gyroscope Resolution ACCELERATION DATA X-Axis Accelerometer (X_ACCL_LOW, X_ACCL_OUT) Y-Axis Accelerometer (Y_ACCL_LOW, Y_ACCL_OUT) Z-Axis Accelerometer (Z_ACCL_LOW, Z_ACCL_OUT) Accelerometer Resolution DELTA ANGLES X-Axis Delta Angle (X_DELTANG_LOW, X_DELTANG_OUT) Y-Axis Delta Angle (Y_DELTANG_LOW, Y_DELTANG_OUT) Z-Axis Delta Angle (Z_DELTANG_LOW, Z_DELTANG_OUT) Delta Angle Resolution DELTA VELOCITY X-Axis Delta Velocity (X_DELTVEL_LOW, X_DELTVEL_OUT) Y-Axis Delta Velocity (Y_DELTVEL_LOW, Y_DELTVEL_OUT) Z-Axis Delta Velocity (Z_DELTVEL_LOW, Z_DELTVEL_OUT) Delta Velocity Resolution Product Identification, PROD_ID CALIBRATION Calibration, Gyroscope Scale, X_GYRO_SCALE Calibration, Gyroscope Scale, Y_GYRO_SCALE Calibration, Gyroscope Scale, Z_GYRO_SCALE Calibration, Accelerometer Scale, X_ACCL_SCALE Calibration, Accelerometer Scale, Y_ACCL_SCALE Calibration, Accelerometer Scale, Z_ACCL_SCALE Calibration, Gyroscope Bias, XG_BIAS_LOW, XG_BIAS_HIGH Calibration, Gyroscope Bias, YG_BIAS_LOW, YG_BIAS_HIGH Calibration, Gyroscope Bias, ZG_BIAS_LOW, ZG_BIAS_HIGH Calibration, Accelerometer Bias, XA_BIAS_LOW, XA_BIAS_HIGH Calibration, Accelerometer Bias, YA_BIAS_LOW, YA_BIAS_HIGH Calibration, Accelerometer Bias, ZA_BIAS_LOW, ZA_BIAS_HIGH Scratch Registers, USER_SCR_x Flash Memory Endurance Counter, FLSHCNT_LOW, FLSHCNT_HIGH Global Commands, GLOB_CMD Software Reset Factory Calibration Restore Flash Memory Update On Demand Self Test (ODST) Bias Correction Update Auxiliary I/O Line Configuration, FNCTIO_CTRL Data Ready Indicator Input Sync/Clock Control General-Purpose I/O Control, GPIO_CTRL Miscellaneous Configuration, CONFIG Point of Percussion Linear Acceleration on Effect on Gyroscope Bias Decimation Filter, DEC_RATE Data Update Rate in External Sync Modes Continuous Bias Estimation (CBE), NULL_CNFG Scaling the Input Clock (PPS Mode), SYNC_SCALE FIR Filter Control, FILTR_BNK_0, FILTR_BNK_1 Firmware Revision, FIRM_REV Firmware Revision Day and Month, FIRM_DM Firmware Revision Year, FIRM_Y Boot Revision Number, BOOT_REV Continuous SRAM Testing Signature CRC, Calibration Values, CAL_SIGTR_LWR Signature CRC, Calibration Values, CAL_SIGTR_UPR Derived CRC, Calibration Values, CAL_DRVTN_LWR Derived CRC, Calibration Values, CAL_DRVTN_UPR Signature CRC, Program Code, CODE_SIGTR_LWR Signature CRC, Program Code, CODE_SIGTR_UPR Derived CRC, Program Code, CODE_DRVTN_LWR Derived CRC, Program Code, CODE_DRVTN_UPR Lot Specific Serial Number, SERIAL_NUM FIR FILTERS FIR Filter Bank A, FIR_COEF_A000 to FIR_COEF_A119 FIR Filter Bank B, FIR_COEF_B000 to FIR_COEF_B119 FIR Filter Bank C, FIR_COEF_C000 to FIR_COEF_C119 FIR Filter Bank D, FIR_COEF_D000 to FIR_COEF_D119 Default Filter Performance APPLICATIONS INFORMATION MOUNTING BEST PRACTICES PREVENTING MISINSERTION EVALUATION TOOLS Breakout Board, ADIS16IMU1/PCBZ PC-Based Evaluation, EVAL-ADIS2 POWER SUPPLY CONSIDERATIONS PACKAGING AND ORDERING INFORMATION OUTLINE DIMENSIONS ORDERING GUIDE