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Anwendungshinweise

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  Voltage Reference Circuit Collection &mdash AN42
  PDF, 1.7 Mb, Datei veröffentlicht: Jun 1, 1991
  A wide variety of voltage reference circuits are detailed in this extensive guidebook of circuits. The detailed schematics cover simple and precision approaches at a variety of power levels. Included are 2 and 3 terminal devices in series and shunt modes for positive and negative polarities. Appended sections cover resistor and capacitor selection and trimming techniques.
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  Understanding and Applying Voltage References &mdash AN82
  PDF, 172 Kb, Datei veröffentlicht: Nov 1, 1999
  Just how do bandgaps and buried Zeners stack up against Weston cells? Did you know your circuit board may induce more drift in a reference than time and temperature? Learn the answers to these and other commonly asked reference questions ranging from burn-in recommendations to ΔVBE generation in this Application Note.
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  Application Note 82
  November 1999
  Understanding and Applying Voltage References 30
  2 4 20
  8 3
  10 –20
  16
  32 4
  –30 5 Today’s IC reference technology is divided along two
  lines: bandgap references, which balance the temperature coefficient of a forward-biased diode junction against
  that of a ∆VBE (see Appendix B); and buried Zeners (see
  Appendix A), which use subsurface breakdown to achieve
  outstanding long-term stability and low noise. With few
  exceptions, both reference types use additional on-chip
  circuitry to further minimize temperature drift and trim
  output voltage to an exact value. Bandgap references are
  generally used in systems of up to 12 bits; buried Zeners
  take over from there in higher accuracy systems.
  , LTC and LT are registered trademarks of Linear Technology Corporation. –1 5
  3
  2 64 6
  1 –40 As with other specialized electronic fields, the field of
  monolithic references has its own vocabulary. We’ve …

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  A Standards Lab Grade 20-Bit DAC with 0.1ppm/В° Drift: The Dedicated Art of Digitizing One Part Per Million &mdash AN86
  PDF, 540 Kb, Datei veröffentlicht: Jan 1, 2001
  This publication details a true 1ppm D-to-A converter. Total DC error of this processor corrected DAC remains within 1ppm from 18-32°C, including reference drift. DAC error exclusive of reference drift is substantially better. Construction details and performance verification techniques are included, along with a complete software listing.
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  Application Note 86
  January 2001
  A Standards Lab Grade 20-Bit DAC with 0.1ppm/В°C Drift
  The Dedicated Art of Digitizing One Part Per Million
  Jim Williams
  J. Brubaker
  P. Copley
  J. Guerrero
  F. Oprescu INTRODUCTION
  Significant progress in high precision, instrumentation
  grade D-to-A conversion has recently occurred. Ten years
  ago 12-bit D-to-A converters (DACs) were considered
  premium devices. Today, 16-bit DACs are available and
  increasingly common in system design. These are true
  precision devices with less than 1LSB linearity error and
  1ppm/В°C drift.1 Nonetheless, there are DAC applications
  that require even higher performance. Automatic test
  equipment, instruments, calibration apparatus, laser trimmers, medical electronics and other applications often
  require DAC accuracy beyond 16 bits. 18-bit DACs have
  been produced in circuit assembly form, although they are
  expensive and require frequent calibration. 20 and even
  23+ (0.1ppm!) bit DACs are represented by manually
  switched Kelvin-Varley dividers. These devices, although …

Konstruktionshinweise

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  Don't Be Fooled By Voltage Reference Long-Term Drift and Hysteresis &mdash DN229
  PDF, 98 Kb, Datei veröffentlicht: Apr 3, 2001
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  Don’t Be Fooled by Voltage Reference Long-Term Drift
  and Hysteresis – Design Note 229
  John Wright Lies About Long-Term Drift
  Some manufacturers are now touting phenomenal
  long-term drift specifications, based on accelerated
  high temperature testing. THIS IS A DELIBERATE
  LIE! Long-term drift cannot be extrapolated from
  accelerated high temperature testing. The only way
  long-term drift can be determined is to measure it over
  the time interval of interest. The erroneous technique
  produces numbers that are wildly optimistic and uses
  the Arrhenius Equation to derive an acceleration factor
  from elevated temperature readings. The equation is:
  AF = e EA вЋ› 1 1 вЋћ
  ⎜ – ⎟
  K вЋќ T1 T2вЋ  where: E A = Activation Energy (Assume 0.7)
  K = Boltzmann’s Constant
  T2 = Test Condition in В°Kelvin
  T1 = Use Condition Temperature in В°Kelvin Equation the acceleration factor is 767 and the projected
  “bogus” long-term drift is 0.156ppm/1000hr at 30°C.
  For a 2.5V reference, this corresponds to a 0.39ОјV shift
  after 1000 hours. This is pretty hard to determine (read
  impossible) if the peak-to-peak output noise is larger …

Artikel

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  How to Choose a Voltage Reference &mdash LT Journal
  PDF, 282 Kb, Datei veröffentlicht: Mar 1, 2009
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  L DESIGN FEATURES How to Choose a Voltage Reference
  by Brendan Whelan Why Voltage References? 5V It is an analog world. All electronic
  devices must in some way interact with
  the “real” world, whether they are in
  an automobile, microwave oven or cell
  phone. To do that, electronics must be
  able to map real world measurements
  (speed, pressure, length, temperature)
  to a measurable quantity in the electronics world (voltage). Of course, to
  measure voltage, you need a standard
  to measure against. That standard is
  a voltage reference. The question for
  any system designer is not whether he
  needs a voltage reference, but rather,
  which one?
  A voltage reference is simply that—a
  circuit or circuit element that provides
  a known potential for as long as the circuit requires it. This may be minutes,
  hours or years. If a product requires
  information about the world, such VIN 18k LTC1286
  1
  2 LT1634-4.096 0.1ВµF 3
  4 VREF VCC +IN CLK –IN DOUT GND CS/SHDN 8 5V 7 …

Herstellerklassifikation

• Signal Conditioning > Voltage References > Shunt Voltage References
• Space & Harsh Environment > Extended Temperature Plastic (H & MP) > Extended Temperature (H & MP) Voltage References