Datasheet Texas Instruments SN74BCT8374 — Datenblatt

HerstellerTexas Instruments
SerieSN74BCT8374
Datasheet Texas Instruments SN74BCT8374

Scannen Sie Testgeräte mit kantengetriggerten Flip-Flops vom Typ Octal D.

Datenblätter

Datasheet
TSP

Preise

Status

SN74BCT8374DWSN74BCT8374DWRSN74BCT8374NT
Lifecycle StatusObsolete (Manufacturer has discontinued the production of the device)Obsolete (Manufacturer has discontinued the production of the device)Obsolete (Manufacturer has discontinued the production of the device)
Manufacture's Sample AvailabilityNoNoNo

Verpackung

SN74BCT8374DWSN74BCT8374DWRSN74BCT8374NT
N123
Pin242424
Package TypeDWDWNT
Industry STD TermSOICSOICPDIP
JEDEC CodeR-PDSO-GR-PDSO-GR-PDIP-T
Width (mm)7.57.56.73
Length (mm)15.415.431.64
Thickness (mm)2.352.354.57
Pitch (mm)1.271.272.54
Max Height (mm)2.652.655.08
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Öko-Plan

SN74BCT8374DWSN74BCT8374DWRSN74BCT8374NT
RoHSNot CompliantNot CompliantNot Compliant
Pb FreeNoNoNo

Modellreihe

Herstellerklassifikation

  • Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic