Datasheet Texas Instruments SN74BCT8374DW — Datenblatt

HerstellerTexas Instruments
SerieSN74BCT8374
ArtikelnummerSN74BCT8374DW
Datasheet Texas Instruments SN74BCT8374DW

Scannen Sie Testgeräte mit kantengetriggerten Oktal-D-Flip-Flops 24-SOIC 0 bis 70

Datenblätter

Datasheet
TSP

Preise

Status

Lifecycle StatusObsolete (Manufacturer has discontinued the production of the device)
Manufacture's Sample AvailabilityNo

Verpackung

Pin24
Package TypeDW
Industry STD TermSOIC
JEDEC CodeR-PDSO-G
Width (mm)7.5
Length (mm)15.4
Thickness (mm)2.35
Pitch (mm)1.27
Max Height (mm)2.65
Mechanical DataHerunterladen

Öko-Plan

RoHSNot Compliant
Pb FreeNo

Modellreihe

Serie: SN74BCT8374 (3)

Herstellerklassifikation

  • Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic