Datasheet Texas Instruments SN74BCT8240A — Datenblatt

HerstellerTexas Instruments
SerieSN74BCT8240A
Datasheet Texas Instruments SN74BCT8240A

Boundary-Scan-Testgerät IEEE Std 1149.1 (JTAG) mit oktalinvertierenden Puffern

Datenblätter

Scan Test Devices With Octal Inverting Buffers datasheet
PDF, 424 Kb, Revision: E, Datei veröffentlicht: Dec 1, 1996
Auszug aus dem Dokument

Preise

Status

SN74BCT8240ADW
Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Verpackung

SN74BCT8240ADW
N1
Pin24
Package TypeDW
Industry STD TermSOIC
JEDEC CodeR-PDSO-G
Package QTY25
CarrierTUBE
Device MarkingBCT8240A
Width (mm)7.5
Length (mm)15.4
Thickness (mm)2.35
Pitch (mm)1.27
Max Height (mm)2.65
Mechanical DataHerunterladen

Parameter

Parameters / ModelsSN74BCT8240ADW
SN74BCT8240ADW
Bits8
F @ Nom Voltage(Max), Mhz70
ICC @ Nom Voltage(Max), mA52
Operating Temperature Range, C0 to 70
Output Drive (IOL/IOH)(Max), mA64/-15
Package GroupSOIC
Package Size: mm2:W x L, PKG24SOIC: 160 mm2: 10.3 x 15.5(SOIC)
RatingCatalog
Technology FamilyBCT
VCC(Max), V5.5
VCC(Min), V4.5
Voltage(Nom), V5
tpd @ Nom Voltage(Max), ns9

Öko-Plan

SN74BCT8240ADW
RoHSCompliant

Anwendungshinweise

  • Programming CPLDs Via the 'LVT8986 LASP
    PDF, 819 Kb, Datei veröffentlicht: Nov 1, 2005
    This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to

Modellreihe

Serie: SN74BCT8240A (1)

Herstellerklassifikation

  • Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic