Datasheet Texas Instruments SN74ABTH18652APM — Datenblatt

HerstellerTexas Instruments
SerieSN74ABTH18652A
ArtikelnummerSN74ABTH18652APM
Datasheet Texas Instruments SN74ABTH18652APM

Scan-Testgeräte mit 18-Bit-Transceivern und Registern 64-LQFP -40 bis 85

Datenblätter

Scan Test Devices With 18-Bit Bus Transceivers And Registers datasheet
PDF, 603 Kb, Revision: D, Datei veröffentlicht: Jul 1, 1996
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Preise

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Verpackung

Pin64
Package TypePM
Industry STD TermLQFP
JEDEC CodeS-PQFP-G
Package QTY160
CarrierJEDEC TRAY (10+1)
Device MarkingABTH18652A
Width (mm)10
Length (mm)10
Thickness (mm)1.4
Pitch (mm).5
Max Height (mm)1.6
Mechanical DataHerunterladen

Parameter

Bits18
F @ Nom Voltage(Max)150 Mhz
ICC @ Nom Voltage(Max)24 mA
Operating Temperature Range-40 to 85 C
Output Drive (IOL/IOH)(Max)64/-32 mA
Package GroupLQFP
Package Size: mm2:W x L64LQFP: 144 mm2: 12 x 12(LQFP) PKG
RatingCatalog
Technology FamilyABT
VCC(Max)5.5 V
VCC(Min)4.5 V
Voltage(Nom)5 V
tpd @ Nom Voltage(Max)5.4 ns

Öko-Plan

RoHSCompliant

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Modellreihe

Serie: SN74ABTH18652A (1)
  • SN74ABTH18652APM

Herstellerklassifikation

  • Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic