Datasheet Texas Instruments SNJ54BCT8240AFK — Datenblatt

HerstellerTexas Instruments
SerieSN54BCT8240A
ArtikelnummerSNJ54BCT8240AFK
Datasheet Texas Instruments SNJ54BCT8240AFK

Scan-Testgeräte mit Oktalpuffern 28-LCCC -55 bis 125

Datenblätter

Scan Test Devices With Octal Inverting Buffers datasheet
PDF, 424 Kb, Revision: E, Datei veröffentlicht: Dec 1, 1996
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Preise

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Verpackung

Pin28282828
Package TypeFKFKFKFK
Industry STD TermLCCCLCCCLCCCLCCC
JEDEC CodeS-CQCC-NS-CQCC-NS-CQCC-NS-CQCC-N
Package QTY1111
CarrierTUBETUBETUBETUBE
Device Marking5962-SNJ54BCT8240AFK9174601Q3A
Width (mm)11.4311.4311.4311.43
Length (mm)11.4311.4311.4311.43
Thickness (mm)1.831.831.831.83
Pitch (mm)1.271.271.271.27
Max Height (mm)2.032.032.032.03
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Parameter

Bits8
ICC @ Nom Voltage(Max)52 mA
Input TypeTTL
Operating Temperature Range-55 to 125 C
Output Drive (IOL/IOH)(Max)64/-15 mA
Output TypeTTL
Package GroupLCCC
Package Size: mm2:W x L28LCCC: 131 mm2: 11.43 x 11.43(LCCC) PKG
RatingMilitary
Technology FamilyBCT
VCC(Max)5.5 V
VCC(Min)4.5 V
tpd @ Nom Voltage(Max)9 ns

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Modellreihe

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  • Semiconductors > Space & High Reliability > Logic Products > Specialty Logic Products > Boundary Scan (JTAG)