Datasheet Texas Instruments OPA547T-1G3 — Datenblatt

Hochspannungs- und Hochstrom-Operationsverstärker mit Abschaltfunktion 7-TO-220 -40 bis 85

Datenblätter

PDF, 925 Kb, Revision: F, Datei veröffentlicht: Jul 21, 2005

Auszug aus dem Dokument

Lifecycle Status	Active (Recommended for new designs)
Manufacture's Sample Availability	Yes

Additional Features	Adj Current Limit,Shutdown
Architecture	Bipolar
CMRR(Min)	80 dB
CMRR(Typ)	95 dB
GBW(Typ)	1 MHz
Input Bias Current(Max)	500000 pA
Iq per channel(Max)	15 mA
Iq per channel(Typ)	10 mA
Number of Channels	1
Offset Drift(Typ)	25 uV/C
Operating Temperature Range	-40 to 85 C
Output Current(Typ)	500 mA
Package Group	TO-220
Package Size: mm2:W x L	See datasheet (TO-220) PKG
Rail-to-Rail	In to V-
Rating	Catalog
Slew Rate(Typ)	6 V/us
Total Supply Voltage(Max)	60 +5V=5, +/-5V=10
Total Supply Voltage(Min)	8 +5V=5, +/-5V=10
Vos (Offset Voltage @ 25C)(Max)	5 mV

RoHS

Compliant

Evaluation Modules & Boards: OPAMPEVM
Universal Operational Amplifier Evaluation Module
Lifecycle Status: Active (Recommended for new designs)
- Herunterladen
Evaluation Modules & Boards: OPA547EVM
OPA547 Evaluation Module
Lifecycle Status: Active (Recommended for new designs)
- Herunterladen

Herunterladen
Power Amplifier Stress and Power Handling Limitations
PDF, 55 Kb, Datei veröffentlicht: Sep 27, 2000
To achieve reliable power amplifier designs you must consider the stress on the amplifier compared to its power handling limitations. Power handling limits are specified by the Safe Operating Area (SOA) curves of the power amp. Stress on the amplifier depends on amplifier load and signal conditions which can be evaluated with straightforward techniques.
Herunterladen
DC MOTOR SPEED CONTROLLER: Control a DC Motor without Tachometer Feedback
PDF, 50 Kb, Datei veröffentlicht: Sep 27, 2000
DC motor speed is often regulated with a closed-loop speed controller using tachometer feedback. It is possible, however, to control dc motor speed without tachometer feedback.
Herunterladen
MTTF, Failrate, Reliability, and Life Testing
PDF, 51 Kb, Datei veröffentlicht: Oct 4, 2000
At Burr-Brown, we characterize and qualify the reliability of our devices through high temperature life testing. The results of this testing are quantified with such values as MTTF and failure rate. This information can be very valuable when used for comparative purposes or applied to reliablility calculations. However, this information loses its worth if it is not precisely understood and appropr

Serie: OPA547 (9)

OPA547T1G3, OPA547T 1G3