Datasheet Texas Instruments TLV5610IYZT — Datenblatt
Hersteller | Texas Instruments |
Serie | TLV5610IYZ |
Artikelnummer | TLV5610IYZT |
2,7 V bis 5,5 V, 12-Bit-Oktal-DAC im Wafer-Chip-Scale-Paket 20-DSBGA -40 bis 85
Datenblätter
2.7V to 5.5V, 12-Bit, Octal DAC in Wafer Chip Scale Package datasheet
PDF, 728 Kb, Revision: A, Datei veröffentlicht: Jul 31, 2006
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Preise
Status
Lifecycle Status | Active (Recommended for new designs) |
Manufacture's Sample Availability | No |
Verpackung
Pin | 20 |
Package Type | YZ |
Package QTY | 250 |
Carrier | SMALL T&R |
Device Marking | TLV5610IYZ |
Parameter
Code to Code Glitch(Typ) | 4 nV-sec |
DAC Architecture | String |
DAC Channels | 8 |
Gain Error(Max) | 0.6 %FSR |
INL(Max) | 6 +/-LSB |
Interface | SPI |
Offset Error(Max) | N/A % |
Operating Temperature Range | -40 to 85 C |
Output Range Max. | 5.1 mA/V |
Output Type | Buffered Voltage |
Power Consumption(Typ) | 18 mW |
Rating | Catalog |
Reference: Type | Ext |
Resolution | 12 Bits |
Sample / Update Rate | 0.283 MSPS |
Settling Time | 1 µs |
Special Features | SDO |
Zero Code Error(Typ) | 30 mV |
Öko-Plan
RoHS | Compliant |
Modellreihe
Serie: TLV5610IYZ (2)
- TLV5610IYZR TLV5610IYZT
Herstellerklassifikation
- Semiconductors > Data Converters > Digital-to-Analog Converters (DACs) > Precision DACs (=<10MSPS)