Datasheet Texas Instruments TLV5610IYZT — Datenblatt

HerstellerTexas Instruments
SerieTLV5610IYZ
ArtikelnummerTLV5610IYZT
Datasheet Texas Instruments TLV5610IYZT

2,7 V bis 5,5 V, 12-Bit-Oktal-DAC im Wafer-Chip-Scale-Paket 20-DSBGA -40 bis 85

Datenblätter

2.7V to 5.5V, 12-Bit, Octal DAC in Wafer Chip Scale Package datasheet
PDF, 728 Kb, Revision: A, Datei veröffentlicht: Jul 31, 2006
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Preise

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Verpackung

Pin20
Package TypeYZ
Package QTY250
CarrierSMALL T&R
Device MarkingTLV5610IYZ

Parameter

Code to Code Glitch(Typ)4 nV-sec
DAC ArchitectureString
DAC Channels8
Gain Error(Max)0.6 %FSR
INL(Max)6 +/-LSB
InterfaceSPI
Offset Error(Max)N/A %
Operating Temperature Range-40 to 85 C
Output Range Max.5.1 mA/V
Output TypeBuffered Voltage
Power Consumption(Typ)18 mW
RatingCatalog
Reference: TypeExt
Resolution12 Bits
Sample / Update Rate0.283 MSPS
Settling Time1 µs
Special FeaturesSDO
Zero Code Error(Typ)30 mV

Öko-Plan

RoHSCompliant

Modellreihe

Serie: TLV5610IYZ (2)

Herstellerklassifikation

  • Semiconductors > Data Converters > Digital-to-Analog Converters (DACs) > Precision DACs (=<10MSPS)